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SN74BCT8245ADWE4

更新时间： 2024-11-04 00:01:19
品牌 Logo 应用领域
德州仪器 - TI 总线驱动器总线收发器逻辑集成电路测试光电二极管信息通信管理
页数 文件大小 规格书
27页 484K
描述
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

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SN74BCT8245ADWE4 技术参数

是否无铅： 不含铅是否Rohs认证： 符合
生命周期：Obsolete零件包装代码：SOIC
包装说明：SOP, SOP24,.4针数：24
Reach Compliance Code：unknownHTS代码：8542.39.00.01
风险等级：5.62其他特性：WITH DIRECTION CONTROL
控制类型：COMMON CONTROL计数方向：BIDIRECTIONAL
系列：BCT/FBTJESD-30 代码：R-PDSO-G24
JESD-609代码：e4长度：15.4 mm
逻辑集成电路类型：BOUNDARY SCAN BUS TRANSCEIVER最大I（ol）：0.064 A
湿度敏感等级：1位数：8
功能数量：1端口数量：2
端子数量：24最高工作温度：70 °C
最低工作温度：输出特性：3-STATE
输出极性：TRUE封装主体材料：PLASTIC/EPOXY
封装代码：SOP封装等效代码：SOP24,.4
封装形状：RECTANGULAR封装形式：SMALL OUTLINE
包装方法：TUBE峰值回流温度（摄氏度）：260
电源：5 V最大电源电流（ICC）：52 mA
Prop。Delay @ Nom-Sup：10 ns传播延迟（tpd）：10 ns
认证状态：Not Qualified座面最大高度：2.65 mm
子类别：Bus Driver/Transceivers最大供电电压 (Vsup)：5.5 V
最小供电电压 (Vsup)：4.5 V标称供电电压 (Vsup)：5 V
表面贴装：YES技术：BICMOS
温度等级：COMMERCIAL端子面层：Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式：GULL WING端子节距：1.27 mm
端子位置：DUAL处于峰值回流温度下的最长时间：NOT SPECIFIED
翻译：N/A宽度：7.5 mm
Base Number Matches：1

SN74BCT8245ADWE4 数据手册

 浏览型号SN74BCT8245ADWE4的Datasheet PDF文件第2页浏览型号SN74BCT8245ADWE4的Datasheet PDF文件第3页浏览型号SN74BCT8245ADWE4的Datasheet PDF文件第4页浏览型号SN74BCT8245ADWE4的Datasheet PDF文件第5页浏览型号SN74BCT8245ADWE4的Datasheet PDF文件第6页浏览型号SN74BCT8245ADWE4的Datasheet PDF文件第7页 
SN54BCT8245A, SN74BCT8245A  
SCAN TEST DEVICES  
WITH OCTAL BUS TRANSCEIVERS  
SCBS043E – MAY 1990 – REVISED JULY 1996  
SN54BCT8245A . . . JT PACKAGE  
SN74BCT8245A . . . DW OR NT PACKAGE  
(TOP VIEW)  
Members of the Texas Instruments  
SCOPE Family of Testability Products  
Octal Test-Integrated Circuits  
Functionally Equivalent to ’F245 and  
’BCT245 in the Normal- Function Mode  
DIR  
B1  
B2  
B3  
B4  
GND  
B5  
B6  
B7  
B8  
1
2
3
4
5
6
7
8
9
10  
24 OE  
23 A1  
22 A2  
21 A3  
20 A4  
19 A5  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
Test Operation Synchronous to Test  
Access Port (TAP)  
18  
V
CC  
17 A6  
16 A7  
Implement Optional Test Reset Signal by  
Recognizing a Double-High-Level Voltage  
(10 V) on TMS Pin  
15  
A8  
TDO 11  
TMS 12  
14 TDI  
13 TCK  
SCOPE Instruction Set  
– IEEE Standard 1149.1-1990 Required  
Instructions, Optional INTEST, CLAMP,  
and HIGHZ  
– Parallel-Signature Analysis at Inputs  
– Pseudo-Random Pattern Generation  
From Outputs  
SN54BCT8245A . . . FK PACKAGE  
(TOP VIEW)  
– Sample Inputs/Toggle Outputs  
4
3
2
1
28 27 26  
25  
5
6
7
8
9
A2  
A1  
OE  
NC  
DIR  
B1  
A8  
TDI  
TCK  
Package Options Include Plastic  
24  
23  
Small-Outline (DW) Packages, Ceramic  
Chip Carriers (FK), and Standard Plastic  
and Ceramic 300-mil DIPs (JT, NT)  
22 NC  
21 TMS  
20 TDO  
19 B8  
10  
11  
description  
B2  
The ’BCT8245A scan test devices with octal bus  
transceivers are members of the Texas  
12 13 14 15 16 17 18  
Instruments SCOPE  
testability integrated-  
circuit family. This family of devices supports IEEE  
Standard 1149.1-1990 boundary scan to facilitate  
testing of complex circuit-board assemblies. Scan  
access to the test circuitry is accomplished via the  
4-wire test access port (TAP) interface.  
NC – No internal connection  
In the normal mode, these devices are functionally equivalent to the ’F245 and ’BCT245 octal bus transceivers.  
The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device  
terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect  
the functional operation of the SCOPE octal bus transceivers.  
In the test mode, the normal operation of the SCOPE octal bus transceivers is inhibited and the test circuitry  
is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform  
boundary-scan test operations as described in IEEE Standard 1149.1-1990.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE is a trademark of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...27

中文翻译

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SN74BCT8245ADWE4 替代型号

型号 品牌 替代类型 描述 数据表
SN74BCT8245ANT TI

完全替代

 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN74BCT8245ADWR TI

完全替代

 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN74BCT8245ADW TI

完全替代

 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

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