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SN74BCT8244ANTE4

更新时间： 2024-09-20 22:47:51
品牌 Logo 应用领域
德州仪器 - TI 总线驱动器总线收发器逻辑集成电路测试光电二极管信息通信管理
页数 文件大小 规格书
26页 468K
描述
SCAN TEST DEVICES WITH OCTAL BUFFERS

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SN74BCT8244ANTE4 技术参数

是否无铅： 不含铅是否Rohs认证： 符合
生命周期：Obsolete零件包装代码：DIP
包装说明：DIP, DIP24,.3针数：24
Reach Compliance Code：compliantHTS代码：8542.39.00.01
风险等级：5.5控制类型：ENABLE LOW
系列：BCT/FBTJESD-30 代码：R-PDIP-T24
JESD-609代码：e4长度：31.64 mm
负载电容（CL）：50 pF逻辑集成电路类型：BOUNDARY SCAN BUS DRIVER
最大I（ol）：0.064 A位数：4
功能数量：2端口数量：2
端子数量：24最高工作温度：70 °C
最低工作温度：输出特性：3-STATE
输出极性：TRUE封装主体材料：PLASTIC/EPOXY
封装代码：DIP封装等效代码：DIP24,.3
封装形状：RECTANGULAR封装形式：IN-LINE
包装方法：TUBE峰值回流温度（摄氏度）：NOT SPECIFIED
最大电源电流（ICC）：52 mAProp。Delay @ Nom-Sup：8.5 ns
传播延迟（tpd）：8.5 ns认证状态：Not Qualified
座面最大高度：5.08 mm子类别：Bus Driver/Transceivers
最大供电电压 (Vsup)：5.5 V最小供电电压 (Vsup)：4.5 V
标称供电电压 (Vsup)：5 V表面贴装：NO
技术：BICMOS温度等级：COMMERCIAL
端子面层：Nickel/Palladium/Gold (Ni/Pd/Au)端子形式：THROUGH-HOLE
端子节距：2.54 mm端子位置：DUAL
处于峰值回流温度下的最长时间：NOT SPECIFIED宽度：7.62 mm
Base Number Matches：1

SN74BCT8244ANTE4 数据手册

 浏览型号SN74BCT8244ANTE4的Datasheet PDF文件第2页浏览型号SN74BCT8244ANTE4的Datasheet PDF文件第3页浏览型号SN74BCT8244ANTE4的Datasheet PDF文件第4页浏览型号SN74BCT8244ANTE4的Datasheet PDF文件第5页浏览型号SN74BCT8244ANTE4的Datasheet PDF文件第6页浏览型号SN74BCT8244ANTE4的Datasheet PDF文件第7页 
SN54BCT8244A, SN74BCT8244A  
SCAN TEST DEVICES  
WITH OCTAL BUFFERS  
SCBS042E – FEBRUARY 1990 – REVISED JULY 1996  
SN54BCT8244A . . . JT PACKAGE  
SN74BCT8244A . . . DW OR NT PACKAGE  
(TOP VIEW)  
Members of the Texas Instruments  
SCOPE Family of Testability Products  
Octal Test-Integrated Circuits  
1OE  
1Y1  
1Y2  
1Y3  
1Y4  
GND  
2Y1  
2Y2  
2Y3  
2OE  
1A1  
1A2  
1A3  
1A4  
2A1  
1
2
3
4
5
6
7
8
9
24  
23  
22  
21  
20  
19  
18  
17  
16  
Functionally Equivalent to ’F244 and  
’BCT244 in the Normal-Function Mode  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
Test Operation Synchronous to Test  
Access Port (TAP)  
V
CC  
2A2  
2A3  
Implement Optional Test Reset Signal by  
Recognizing a Double-High-Level Voltage  
(10 V) on TMS Pin  
2Y4 10  
TDO  
TMS  
15 2A4  
TDI  
TCK  
11  
12  
14  
13  
SCOPE Instruction Set  
– IEEE Standard 1149.1-1990 Required  
Instructions, Optional INTEST, CLAMP  
and HIGHZ  
– Parallel-Signature Analysis at Inputs  
– Pseudo-Random Pattern Generation  
From Outputs  
SN54BCT8244A . . . FK PACKAGE  
(TOP VIEW)  
– Sample Inputs/Toggle Outputs  
4
3
2
1 28 27 26  
25  
5
6
7
8
9
1A2  
1A1  
2OE  
NC  
1OE  
1Y1  
1Y2  
2A4  
TDI  
TCK  
Package Options Include Plastic  
24  
23  
Small-Outline (DW) Packages, Ceramic  
Chip Carriers (FK), and Standard Plastic  
and Ceramic 300-mil DIPs (JT, NT)  
22 NC  
21 TMS  
20 TDO  
19 2Y4  
10  
11  
description  
The ’BCT8244A scan test devices with octal  
buffers are members of the Texas Instruments  
SCOPE testability integrated-circuit family. This  
family of devices supports IEEE Standard  
1149.1-1990 boundary scan to facilitate testing of  
complex circuit-board assemblies. Scan access  
to the test circuitry is accomplished via the 4-wire  
test access port (TAP) interface.  
12 13 14 15 16 17 18  
NC – No internal connection  
In the normal mode, these devices are functionally equivalent to the ’F244 and ’BCT244 octal buffers. The test  
circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals  
or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the  
functional operation of the SCOPE octal buffers.  
In the test mode, the normal operation of the SCOPE octal buffers is inhibited and the test circuitry is enabled  
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform  
boundary-scan test operations, as described in IEEE Standard 1149.1-1990.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE is a trademark of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...26

中文翻译

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SN74BCT8244ANTE4 替代型号

型号 品牌 替代类型 描述 数据表
SN74BCT8244ANT TI

完全替代

 SCAN TEST DEVICES WITH OCTAL BUFFERS
SN74BCT8244ADWE4 TI

完全替代

 SCAN TEST DEVICES WITH OCTAL BUFFERS
SN74BCT8244ADW TI

完全替代

 SCAN TEST DEVICES WITH OCTAL BUFFERS

与SN74BCT8244ANTE4相关器件

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SN74BCT8245A TI

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SN74BCT8245ADW TI

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SN74BCT8245ADWE4 TI

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SN74BCT8245ADWG4 TI

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SN74BCT8245ADWR TI

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SN74BCT8245ADWRE4 TI

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SN74BCT8245ADWRG4 TI

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SN74BCT8245AFK TI

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