是否无铅: | 不含铅 | 是否Rohs认证: | 符合 |
生命周期: | Obsolete | 零件包装代码: | DIP |
包装说明: | DIP, DIP24,.3 | 针数: | 24 |
Reach Compliance Code: | compliant | HTS代码: | 8542.39.00.01 |
风险等级: | 5.44 | 其他特性: | SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN |
控制类型: | ENABLE LOW | 系列: | BCT/FBT |
JESD-30 代码: | R-PDIP-T24 | 长度: | 31.64 mm |
逻辑集成电路类型: | BOUNDARY SCAN BUS DRIVER | 最大I(ol): | 0.064 A |
位数: | 4 | 功能数量: | 2 |
端口数量: | 2 | 端子数量: | 24 |
最高工作温度: | 70 °C | 最低工作温度: | |
输出特性: | 3-STATE | 输出极性: | INVERTED |
封装主体材料: | PLASTIC/EPOXY | 封装代码: | DIP |
封装等效代码: | DIP24,.3 | 封装形状: | RECTANGULAR |
封装形式: | IN-LINE | 包装方法: | TUBE |
峰值回流温度(摄氏度): | NOT SPECIFIED | 电源: | 5 V |
最大电源电流(ICC): | 52 mA | Prop。Delay @ Nom-Sup: | 9 ns |
传播延迟(tpd): | 8 ns | 认证状态: | Not Qualified |
座面最大高度: | 5.08 mm | 子类别: | Bus Driver/Transceivers |
最大供电电压 (Vsup): | 5.5 V | 最小供电电压 (Vsup): | 4.5 V |
标称供电电压 (Vsup): | 5 V | 表面贴装: | NO |
技术: | BICMOS | 温度等级: | COMMERCIAL |
端子形式: | THROUGH-HOLE | 端子节距: | 2.54 mm |
端子位置: | DUAL | 处于峰值回流温度下的最长时间: | NOT SPECIFIED |
宽度: | 7.62 mm |
型号 | 品牌 | 替代类型 | 描述 | 数据表 |
SN74BCT8240ANT | TI |
完全替代 |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS | |
SN74BCT8240ADWR | TI |
类似代替 |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
SN74BCT8244A | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SN74BCT8244ADW | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SN74BCT8244ADWE4 | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SN74BCT8244ADWG4 | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SN74BCT8244ADWR | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SN74BCT8244ADWRE4 | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SN74BCT8244ADWRG4 | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SN74BCT8244ANT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SN74BCT8244ANTE4 | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SN74BCT8244DW | TI |
获取价格 |
Scan Test Devices With Octal Buffers 24-SOIC 0 to 70 |