SN74AUC2G00
DUAL 2-INPUT POSITIVE-NAND GATE
www.ti.com
SCES440A–MAY 2003–REVISED MARCH 2005
FEATURES
DCT OR DCU PACKAGE
(TOP VIEW)
•
Available in the Texas Instruments
NanoStar™ and NanoFree™ Packages
1A
1B
2Y
V
CC
1
2
3
4
8
7
6
5
•
Optimized for 1.8-V Operation and Is 3.6-V I/O
Tolerant to Support Mixed-Mode Signal
Operation
1Y
2B
2A
GND
•
Ioff Supports Partial-Power-Down Mode
Operation
YEP OR YZP PACKAGE
(BOTTOM VIEW)
•
•
•
•
•
Sub-1-V Operable
Max tpd of 1.2 ns at 1.8 V
Low Power Consumption, 10 µA at 1.8 V
±8-mA Output Drive at 1.8 V
4
3
2
1
5
6
7
8
GND
2Y
2A
2B
1Y
1B
1A
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
V
CC
•
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
DESCRIPTION/ORDERING INFORMATION
This dual 2-input positive-NAND gate is operational at 0.8-V to 2.7-V VCC, but is designed specifically for 1.65-V
to 1.95-V VCC operation.
The SN74AUC2G00 performs the Boolean function Y = A B or Y = A + B in positive logic.
NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the
die as the package.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
ORDERING INFORMATION
TA
PACKAGE(1)
ORDERABLE PART NUMBER
TOP-SIDE MARKING(2)
NanoStar™ – WCSP (DSBGA)
0.23-mm Large Bump – YEP
Tape and reel
Tape and reel
SN74AUC2G00YEPR
_ _ _UA_
NanoFree™ – WCSP (DSBGA)
0.23-mm Large Bump – YZP (Pb-free)
SN74AUC2G00YZPR
–40°C to 85°C
SSOP – DCT
Tape and reel
Tape and reel
SN74AUC2G00DCTR
SN74AUC2G00DCUR
U00_
U00_
VSSOP – DCU
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
(2) DCT: The actual top-side marking has three additional characters that designate the year, month, and assembly/test site.
DCU: The actual top-side marking has one additional character that designates the assembly/test site.
YEP/YZP: The actual top-side marking has three preceding characters to denote year, month, and sequence code, and one following
character to designate the assembly/test site.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoStar, NanoFree are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright © 2003–2005, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.