SN74AUC1G125-EP
SINGLE BUS BUFFER GATE
WITH 3-STATE OUTPUT
www.ti.com
SCES670–MARCH 2007
FEATURES
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Controlled Baseline
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Ioff Supports Partial-Power-Down Mode
Operation
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One Assembly Site
One Test Site
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Sub-1-V Operable
Max tpd of 2.5 ns at 1.8 V
Low Power Consumption, 10-µA Max ICC
±8-mA Output Drive at 1.8 V
One Fabrication Site
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Extended Temperature Performance of –55°C
to 125°C
Enhanced Diminishing Manufacturing Sources
(DMS) Support
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
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Enhanced Product-Change Notification
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ESD Protection Exceeds JESD 22
(1)
Qualification Pedigree
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2000-V Human-Body Model (A114-A)
200-V Machine Model (A115-A)
Optimized for 1.8-V Operation and Is 3.6-V I/O
Tolerant to Support Mixed-Mode Signal
Operation
1000-V Charged-Device Model (C101)
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
DCK PACKAGE
(TOP VIEW)
VCC
OE
A
1
2
3
5
4
GND
Y
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
The SN74AUC1G125 is operational at 0.8-V to 2.7-V VCC, but is designed specifically for 1.65-V to 1.95-V VCC
operation.
The SN74AUC1G125 is a single-line driver with a 3-state output. The output is disabled when the output-enable
(OE) input is high.
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2007, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.