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SN74AHCT244-EP PDF预览

SN74AHCT244-EP

更新时间： 2024-09-27 11:58:43
品牌 Logo 应用领域
德州仪器 - TI 驱动器输出元件
页数 文件大小 规格书
9页 432K
描述
OCTAL BUFFER/DRIVER WITH 3-STATE OUTPUTS

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SN74AHCT244-EP 数据手册

 浏览型号SN74AHCT244-EP的Datasheet PDF文件第2页浏览型号SN74AHCT244-EP的Datasheet PDF文件第3页浏览型号SN74AHCT244-EP的Datasheet PDF文件第4页浏览型号SN74AHCT244-EP的Datasheet PDF文件第5页浏览型号SN74AHCT244-EP的Datasheet PDF文件第6页浏览型号SN74AHCT244-EP的Datasheet PDF文件第7页 
SN74AHCT244-EP  
OCTAL BUFFER/DRIVER  
WITH 3-STATE OUTPUTS  
SCLS493A – MAY 2003 – REVISED JUNE 2003  
DW OR PW PACKAGE  
(TOP VIEW)  
Controlled Baseline  
– One Assembly/Test Site, One Fabrication  
Site  
1
2
3
4
5
6
7
8
9
10  
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
1OE  
1A1  
2Y4  
1A2  
2Y3  
1A3  
2Y2  
1A4  
2Y1  
GND  
V
CC  
Extended Temperature Performance of  
–55°C to 125°C  
2OE  
1Y1  
2A4  
1Y2  
2A3  
1Y3  
2A2  
1Y4  
2A1  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
Enhanced Product-Change Notification  
†
Qualification Pedigree  
EPIC (Enhanced-Performance Implanted  
CMOS) Process  
Inputs Are TTL-Voltage Compatible  
Latch-Up Performance Exceeds 250 mA Per  
JESD 17  
ESD Protection Exceeds 1000 V Per  
MIL-STD-833, Method 3015; Exceeds 200 V  
Using Machine Model (C = 200 pF, R = 0)  
†
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
description/ordering information  
This octal buffer/driver is designed specifically to improve both the performance and density of 3-state  
memory-address drivers, clock drivers, and bus-oriented receivers and transmitters.  
The SN74AHCT244 is organized as two 4-bit buffers/line drivers with separate output-enable (OE) inputs.  
When OE is low, the device passes data from the A inputs to the Y outputs. When OE is high, the outputs are  
in the high-impedance state.  
To ensure the high-impedance state during power up or power down, OE should be tied to V through a pullup  
CC  
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.  
ORDERING INFORMATION  
ORDERABLE  
PART NUMBER  
TOP-SIDE  
MARKING  
‡
PACKAGE  
T
A
SOIC – D  
Tape and reel  
SN74AHCT244MDWREP  
SN74AHCT244MPWREP  
AHCT244MEP  
AHT244EP  
–55°C to 125°C  
TSSOP – PW Tape and reel  
‡
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines  
are available at www.ti.com/sc/package.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
EPIC is a trademark of Texas Instruments.  
Copyright 2003, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...9

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SN74AHCT244-EP 替代型号

型号 品牌 替代类型 描述 数据表
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