SN54AHCT132, SN74AHCT132
QUADRUPLE POSITIVE-NAND GATES
WITH SCHMITT-TRIGGER INPUTS
SCLS366F – MAY 1997 – REVISED JANUARY 2000
SN54AHCT132 . . . J OR W PACKAGE
SN74AHCT132 . . . D, DB, DGV, N, OR PW PACKAGE
(TOP VIEW)
EPIC (Enhanced-Performance Implanted
CMOS) Process
Inputs Are TTL-Voltage Compatible
1A
1B
V
CC
Operation From Very Slow Input
Transitions
1
2
3
4
5
6
7
14
13
12
11
4B
4A
4Y
1Y
Temperature-Compensated Threshold
Levels
2A
2B
10 3B
High Noise Immunity
9
8
2Y
3A
3Y
Same Pinouts as ’AHCT00
GND
Latch-Up Performance Exceeds 250 mA Per
JESD 17
SN54AHCT132 . . . FK PACKAGE
(TOP VIEW)
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
3
2
1 20 19
18
Package Options Include Plastic
Small-Outline (D), Shrink Small-Outline
(DB), Thin Very Small-Outline (DGV), Thin
Shrink Small-Outline (PW), and Ceramic
Flat (W) Packages, Ceramic Chip Carriers
(FK), and Standard Plastic (N) and Ceramic
(J) DIPs
4A
17 NC
1Y
NC
2A
4
5
6
7
8
16
4Y
NC
3B
15
14
NC
2B
9 10 11 12 13
description
NC – No internal connection
The ’AHCT132 devices are quadruple
positive-NAND gates.
These devices perform the Boolean function Y = A • B or Y = A + B in positive logic.
Each circuit functions as a NAND gate, but because of the Schmitt action, it has different input threshold levels
for positive- and negative-going signals.
These circuits are temperature compensated and can be triggered from the slowest of input ramps and still give
clean jitter-free output signals.
The SN54AHCT132 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74AHCT132 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
Y
A
B
H
X
L
H
L
L
H
H
X
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
Copyright 2000, Texas Instruments Incorporated
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265