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ꢅꢉ ꢋ ꢌ ꢁꢍ ꢉ ꢎꢏ ꢉꢎ
SCLS483A − JUNE 2003 − REVISED SEPTEMBER 2003
D OR PW PACKAGE
(TOP VIEW)
D
Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
1
2
3
4
5
6
7
14
13
12
11
10
9
1A
1Y
V
CC
D
D
D
D
D
Extended Temperature Performance of
−55°C to 125°C
Enhanced Diminishing Manufacturing
Sources (DMS) Support
6A
6Y
5A
5Y
4A
4Y
2A
2Y
3A
Enhanced Product-Change Notification
3Y
†
8
Qualification Pedigree
GND
EPIC (Enhanced-Performance Implanted
CMOS) Process
D
Operating Range 2-V to 5.5-V V
CC
ESD Protection Exceeds 1500 V Per
MIL-STD-833, Method 3015; Exceeds 150 V
Using Machine Model (C = 200 pF, R = 0)
D
†
Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
description/ordering information
The SN74AHC04 contains six independent inverters. This device performs the Boolean function Y = A.
ORDERING INFORMATION
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
‡
PACKAGE
T
A
SOIC − D
Tape and reel
Tape and reel
SN74AHC04MDREP
SN74AHC04MPWREP
AHC04MEP
AHC04EP
−55°C to 125°C
TSSOP − PW
‡
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines
are available at www.ti.com/sc/package.
FUNCTION TABLE
(each inverter)
INPUT
A
OUTPUT
Y
H
L
L
H
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments.
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Copyright 2003, Texas Instruments Incorporated
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