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SN74ACT8999DW PDF预览

SN74ACT8999DW

更新时间： 2024-09-29 12:47:03
品牌 Logo 应用领域
德州仪器 - TI 复用器微控制器和处理器外围集成电路uCs集成电路uPs集成电路光电二极管
页数 文件大小 规格书
29页 435K
描述
SCAN-PATH SELECTORS WITH 8-BIT BIDIRECTIONAL DATA BUSES SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP MULTIPLEXERS

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中文翻译

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SN74ACT8999DW 技术参数

是否无铅：含铅是否Rohs认证：不符合
生命周期：Obsolete零件包装代码：SOIC
包装说明：SOP, SOP28,.4针数：28
Reach Compliance Code：not_compliantHTS代码：8542.31.00.01
风险等级：5.89Is Samacsys：N
JESD-30 代码：R-PDSO-G28长度：17.9 mm
端子数量：28最高工作温度：85 °C
最低工作温度：-40 °C封装主体材料：PLASTIC/EPOXY
封装代码：SOP封装等效代码：SOP28,.4
封装形状：RECTANGULAR封装形式：SMALL OUTLINE
峰值回流温度（摄氏度）：NOT SPECIFIED电源：5 V
认证状态：Not Qualified座面最大高度：2.65 mm
子类别：Other Microprocessor ICs最大供电电压：5.5 V
最小供电电压：4.5 V标称供电电压：5 V
表面贴装：YES技术：CMOS
温度等级：INDUSTRIAL端子形式：GULL WING
端子节距：1.27 mm端子位置：DUAL
处于峰值回流温度下的最长时间：NOT SPECIFIED宽度：7.5 mm
uPs/uCs/外围集成电路类型：MICROPROCESSOR CIRCUITBase Number Matches：1

SN74ACT8999DW 数据手册

 浏览型号SN74ACT8999DW的Datasheet PDF文件第2页浏览型号SN74ACT8999DW的Datasheet PDF文件第3页浏览型号SN74ACT8999DW的Datasheet PDF文件第4页浏览型号SN74ACT8999DW的Datasheet PDF文件第5页浏览型号SN74ACT8999DW的Datasheet PDF文件第6页浏览型号SN74ACT8999DW的Datasheet PDF文件第7页 
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SCAS158D − JUNE 1990 − REVISED DECEMBER 1996  
SN54ACT8999 . . . JT PACKAGE  
SN74ACT8999 . . . DW OR NT PACKAGE  
(TOP VIEW)  
D
D
D
D
D
D
D
D
Members of theTexas Instruments  
SCOPE Family of Testability Products  
Compatible With the IEEE Standard 1149.1  
(JTAG) Serial Test Bus  
DTDI  
OTMS  
DCO  
DCI  
MCI  
ID1  
ID2  
ID3  
ID4  
ID5  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
Allow Partitioning of System Scan Paths  
2
Can Be Cascaded Horizontally or Vertically  
3
MCO  
4
Select One of Four Secondary Scan Paths  
to Be Included in a Primary Scan Path  
DTDO  
DTCK  
GND  
DTMS1  
DTMS2  
DTMS3  
DTMS4  
DTRST  
TDO  
5
6
Provide Communication Between Primary  
and Remote Test Bus Controllers  
7
V
8
CC  
Include 8-Bit Programmable Binary Counter  
to Count or Initiate Interrupt Signals  
ID6  
ID7  
ID8  
TRST  
TDI  
9
10  
11  
12  
13  
14  
Include 8-Bit Identification Bus for Scan  
Path Identification  
D
Inputs Are TTL Compatible  
TMS  
TCK  
D
EPIC (Enhanced-Performance Implanted  
CMOS) 1-µm Process  
D
Package Options Include Plastic  
SN54ACT8999 . . . FK PACKAGE  
(TOP VIEW)  
Small-Outline (DW) Packages, Ceramic  
Chip Carriers (FK), and Standard Plastic  
(NT) and Ceramic (JT) 300-mil DIPs  
4
3
2 1 28 27 26  
description  
5
25 ID8  
ID1  
MCI  
DCI  
DTDI  
OTMS  
DCO  
MCO  
6
TRST  
24  
23  
22  
21  
20  
19  
The ’ACT8999 are members of the Texas  
7
TDI  
Instruments SCOPEtestability integrated-  
circuit family. This family of components facilitates  
testing of complex circuit-board assemblies.  
8
TCK  
TMS  
TDO  
DTRST  
9
10  
11  
The ’ACT8999 enhance the scan capability of TI’s  
SCOPEfamily by allowing augmentation of a  
system’s primary scan path with secondary scan  
paths (SSPs), which can be individually selected  
by the ’ACT8999 for inclusion in the primary scan  
path. The device also provides buffering of test  
signals to reduce the need for external logic.  
12 13 14 15 16 17 18  
By loading the proper values into the instruction register and data registers, the user can select one of four  
secondary scan paths. This has the effect of shortening the scan path to allow maximum test throughput when  
an individual subsystem (board or box) is to be tested. Any of the device’s six data registers or the instruction  
register can be placed in the device’s scan path, i.e., placed between test data input (TDI) and test data output  
(TDO) for subsequent shift and scan operations.  
All operations of the device except counting are synchronous to the test clock (TCK). The 8-bit programmable  
up/down counter can be used to count transitions on the device condition input (DCI) and output interrupt signals  
via the device condition output (DCO). The device can be configured to count on either the rising or falling edge  
of DCI.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE and EPIC are trademarks of Texas Instruments Incorporated.  
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Copyright 1996, Texas Instruments Incorporated  
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1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251−1443  
1234567...29

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