SN74ACT8997

更新时间： 2024-09-28 23:03:11

品牌	Logo	应用领域
德州仪器 - TI		/
页数	文件大小	规格书
28页	484K
描述
SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS

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SN74ACT8997 数据手册

SN54ACT8997, SN74ACT8997

SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES

SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS

SCAS157D – APRIL 1990 – REVISED DECEMBER 1996

SN54ACT8997 . . . JT PACKAGE

SN74ACT8997 . . . DW OR NT PACKAGE

(TOP VIEW)

Members of the Texas Instruments

SCOPE Family of Testability Products

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Serial Test Bus

DCO

MCO

DCI

MCI

TRST

ID1

ID2

ID3

Allow Partitioning of System Scan Paths

Can Be Cascaded Horizontally or Vertically

DTDO1

DTDO2

DTDO3

DTDO4

GND

DTMS1

DTMS2

DTMS3

DTMS4

DTCK

Select Up to Four Secondary Scan Paths to

Be Included in a Primary Scan Path

Include 8-Bit Programmable Binary Counter

to Count or Initiate Interrupt Signals

ID4

Include 4-Bit Identification Bus for

Scan-Path Identification

DTDI1

DTDI2

DTDI3

DTDI4

TDI

Inputs Are TTL Compatible

EPIC (Enhanced-Performance Implanted

CMOS) 1-µm Process

TDO

TMS

TCK

Package Options Include Plastic

Small-Outline (DW) Packages, Ceramic

Chip Carriers (FK), and Standard Plastic

(NT) and Ceramic (JT) 300-mil DIPs

SN54ACT8997 . . . FK PACKAGE

(TOP VIEW)

description

The ’ACT8997 are members of the Texas

Instruments SCOPE testability integrated-

circuit family. This family of components facilitates

testing of complex circuit-board assemblies.

2 1 28 27 26

TRST

MCI

DCI

DCO

MCO

DTDI3

DTDI4

TDI

TCK

TMS

The ’ACT8997 enhance the scan capability of TI’s

SCOPE family by allowing augmentation of a

system’s primary scan path with secondary scan

paths (SSPs), which can be individually selected

by the ’ACT8997 for inclusion in the primary scan

path. These devices also provide buffering of test

signals to reduce the need for external logic.

DTDO1

DTDO2

TDO

DTCK

12 13 14 15 16 17 18

By loading the proper values into the instruction

to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time. Any

of the device’s six data registers or the instruction register can be placed in the device’s scan path, i.e., placed

between test data input (TDI) and test data output (TDO) for subsequent shift and scan operations.

All operations of the device except counting are synchronous to the test clock pin (TCK). The 8-bit

programmable up/down counter can be used to count transitions on the device condition input (DCI) pin and

output interrupt signals via the device condition output (DCO) pin. The device can be configured to count on

either the rising or falling edge of DCI.

The test access port (TAP) controller is a finite-state machine compatible with IEEE Standard 1149.1.

The SN54ACT8997 is characterized for operation over the full military temperature range of –55°C to 125°C.

The SN74ACT8997 is characterized for operation from 0°C to 70°C.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE and EPIC are trademarks of Texas Instruments Incorporated.

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

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SN74ACT8997 替代型号

型号	品牌	替代类型	描述	数据表
SN54ACT8997	TI	功能相似	SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP

与SN74ACT8997相关器件

型号	品牌	获取价格	描述	数据表
SN74ACT8997DW	TI	获取价格	SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP
SN74ACT8997DWR	TI	获取价格	SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP
SN74ACT8997NT	TI	获取价格	SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP
SN74ACT8999	TI	获取价格	SCAN-PATH SELECTORS WITH 8-BIT BIDIRECTIONAL DATA BUSES SCAN-CONTROLLED IEEE STD 1149.1 (J
SN74ACT8999DW	TI	获取价格	SCAN-PATH SELECTORS WITH 8-BIT BIDIRECTIONAL DATA BUSES SCAN-CONTROLLED IEEE STD 1149.1 (J
SN74ACT8999NT	TI	获取价格	SCAN-PATH SELECTORS WITH 8-BIT BIDIRECTIONAL DATA BUSES SCAN-CONTROLLED IEEE STD 1149.1 (J
SN74ACTQ573PC	FAIRCHILD	获取价格	Bus Driver, ACT Series, 1-Func, 8-Bit, True Output, CMOS, PQCC20, PLASTIC, DIP-20
SN74ACTQ573QSC	FAIRCHILD	获取价格	Bus Driver, ACT Series, 1-Func, 8-Bit, True Output, CMOS, PDSO20, 0.150 INCH, PLASTIC, SSO
SN74ACTQ573QSCX	FAIRCHILD	获取价格	Bus Driver, ACT Series, 1-Func, 8-Bit, True Output, CMOS, PDSO20, 0.150 INCH, PLASTIC, SSO
SN74ACTQ573SCX	FAIRCHILD	获取价格	Bus Driver, ACT Series, 1-Func, 8-Bit, True Output, CMOS, PDSO20, 0.300 INCH, PLASTIC, SO-

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