Datasheet > 逻辑 > 总线驱动器/收发器> SN74ABT8646DW

SN74ABT8646DW

更新时间： 2024-11-24 23:06:11

品牌	Logo	应用领域
德州仪器 - TI		总线收发器测试
页数	文件大小	规格书
27页	388K
描述
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

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SN74ABT8646DW 数据手册

SN54ABT8646, SN74ABT8646

SCAN TEST DEVICES WITH

OCTAL BUS TRANSCEIVERS AND REGISTERS

SCBS123E – AUGUST 1992 – REVISED JULY 1996

SN54ABT8646 . . . JT PACKAGE

SN74ABT8646 . . . DL OR DW PACKAGE

(TOP VIEW)

Members of the Texas Instruments

SCOPE Family of Testability Products

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

CLKAB

SAB

DIR

GND

CLKBA

SBA

Functionally Equivalent to ’F646 and

’ABT646 in the Normal-Function Mode

SCOPE Instruction Set

– IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP,

and HIGHZ

– Parallel-Signature Analysis at Inputs

With Masking Option

A6 10

19 B6

– Pseudo-Random Pattern Generation

From Outputs

TDO 13

TMS

16 TDI

TCK

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Even-Parity Opcodes

Two Boundary-Scan Cells Per I/O for

Greater Flexibility

SN54ABT8646 . . . FK PACKAGE

(TOP VIEW)

State-of-the-Art EPIC-ΙΙB BiCMOS Design

Significantly Reduces Power Dissipation

Package Options Include Plastic

Small-Outline (DW) and Shrink

Small-Outline (DL) Packages, Ceramic Chip

Carriers (FK), and Standard Ceramic DIPs

(JT)

2 1 28 27 26

SBA

CLKBA

CLKAB

SAB

TDI

TCK

TMS

TDO

description

DIR

The ’ABT8646 and scan test devices with octal

bustransceiversandregistersaremembersofthe

12 13 14 15 16 17 18

Texas

Instruments

SCOPE

testability

integrated-circuit family. This family of devices

supports IEEE Standard 1149.1-1990 boundary

scan to facilitate testing of complex circuit-board

assemblies. Scan access to the test circuitry is

accomplished via the 4-wire test access port

(TAP) interface.

In the normal mode, these devices are functionally equivalent to the ’F646 and ’ABT646 octal bus transceivers

and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing

at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does

not affect the functional operation of the SCOPE octal bus transceivers and registers.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3 4 5 6 7...27

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SN74ABT8646DW 替代型号

型号	品牌	替代类型	描述	数据表
SN74ABT8646DWRE4	TI	完全替代	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS
SN74ABT8646DWR	TI	完全替代	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS

与SN74ABT8646DW相关器件

型号	品牌	获取价格	描述	数据表
SN74ABT8646DWE4	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS
SN74ABT8646DWG4	TI	获取价格	ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28, GREEN, PLASTIC, SOIC
SN74ABT8646DWR	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS
SN74ABT8646DWRE4	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS
SN74ABT8652	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN74ABT8652DL	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN74ABT8652DLG4	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN74ABT8652DLR	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN74ABT8652DLRG4	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SN74ABT8652DW	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS

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