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SN74ABT8543 PDF预览

SN74ABT8543

更新时间： 2024-09-16 23:06:11
品牌 Logo 应用领域
德州仪器 - TI 总线收发器测试
页数 文件大小 规格书
25页 357K
描述
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS

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SN74ABT8543 数据手册

 浏览型号SN74ABT8543的Datasheet PDF文件第2页浏览型号SN74ABT8543的Datasheet PDF文件第3页浏览型号SN74ABT8543的Datasheet PDF文件第4页浏览型号SN74ABT8543的Datasheet PDF文件第5页浏览型号SN74ABT8543的Datasheet PDF文件第6页浏览型号SN74ABT8543的Datasheet PDF文件第7页 
SN54ABT8543, SN74ABT8543  
SCAN TEST DEVICES WITH  
OCTAL REGISTERED BUS TRANSCEIVERS  
SCBS120E – AUGUST 1991 – REVISED JULY 1996  
SN54ABT8543 . . . JT PACKAGE  
SN74ABT8543 . . . DL OR DW PACKAGE  
(TOP VIEW)  
Members of the Texas Instruments  
SCOPE Family of Testability Products  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
LEAB  
CEAB  
OEAB  
A1  
A2  
A3  
GND  
A4  
A5  
LEBA  
CEBA  
OEBA  
B1  
B2  
B3  
1
2
3
4
5
6
7
8
9
28  
27  
26  
25  
24  
23  
22  
21  
20  
Functionally Equivalent to ’F543 and  
’ABT543 in the Normal-Function Mode  
SCOPE Instruction Set  
– IEEE Standard 1149.1-1990 Required  
Instructions, Optional INTEST, CLAMP,  
and HIGHZ  
– Parallel-Signature Analysis at Inputs  
With Masking Option  
– Pseudo-Random Pattern Generation  
From Outputs  
– Sample Inputs/Toggle Outputs  
– Binary Count From Outputs  
– Even-Parity Opcodes  
B4  
V
CC  
B5  
A6 10  
19 B6  
A7  
A8  
B7  
B8  
11  
12  
18  
17  
TDO 13  
TMS 14  
16 TDI  
15 TCK  
Two Boundary-Scan Cells Per I/O for  
Greater Flexibility  
SN54ABT8543 . . . FK PACKAGE  
(TOP VIEW)  
State-of-the-Art EPIC-ΙΙB BiCMOS Design  
Significantly Reduces Power Dissipation  
Package Options Include Plastic  
Small-Outline (DW) and Shrink  
Small-Outline (DL) Packages, Ceramic Chip  
Carriers (FK), and Standard Ceramic  
DIPs (JT)  
4
3
2 1 28 27 26  
5
25 B7  
OEBA  
CEBA  
LEBA  
LEAB  
CEAB  
OEAB  
A1  
6
B8  
24  
23  
22  
21  
20  
19  
7
TDI  
TCK  
TMS  
TDO  
A8  
8
9
description  
10  
11  
The ’ABT8543 scan test devices with octal  
registered bus transceivers are members of the  
1213 14 15 16 17 18  
Texas  
Instruments  
SCOPE  
testability  
integrated-circuit family. This family of devices  
supports IEEE Standard 1149.1-1990 boundary  
scan to facilitate testing of complex circuit-board  
assemblies. Scan access to the test circuitry is  
accomplished via the 4-wire test access port  
(TAP) interface.  
In the normal mode, these devices are functionally equivalent to the ’F543 and ’ABT543 octal registered bus  
transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at  
the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not  
affect the functional operation of the SCOPE octal registered bus transceivers.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...25

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SN74ABT8543 替代型号

型号 品牌 替代类型 描述 数据表
SN54ABT8543 TI

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