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SN65LVDT14, SN65LVDT41
SLLS530 – APRIL 2002
MEMORY STICK INTERCONNECT EXTENDER CHIPSET WITH LVDS
SN65LVDT14—ONE DRIVER PLUS FOUR RECEIVERS
SN65LVDT41—FOUR DRIVERS PLUS ONE RECEIVER
FEATURES
APPLICATIONS
D
Integrated 110-Ω Nominal Receiver Line
Termination Resistor
D
Memory Stick Interface Extensions With Long
Interconnects Between Host and Memory
Stick
D
D
D
D
D
D
Operates From a Single 3.3-V Supply
Greater Than 125 Mbps Data Rate
Flow-Through Pin-Out
D
Serial Peripheral Interface (SPI) Interface
Extension to Allow Long Interconnects
Between Master and Slave
LVTTL Compatible Logic I/Os
ESD Protection On Bus Pins Exceeds 16 kV
D
D
MultiMediaCard Interface in SPI Mode
Meets or Exceeds the Requirements of
ANSI/TIA/EIA-644A Standard for LVDS
General-Purpose Asymmetric Bidirectional
Communication
D
20-Pin PW Thin Shrink Small-Outline Package
With 26-Mil Terminal Pitch
DESCRIPTION
The SN65LVDT14 combines one LVDS line driver with
four terminated LVDS line receivers in one package. It
is designed to be used at the Memory Stick end of an
LVDS based Memory Stick interface extension.
TheSN65LVDT41 combines four LVDSlinedriverswith
a single terminated LVDS line receiver in one package.
It is designed to be used at the host end of an LVDS
based Memory Stick interface extension.
SN65LVDT41 LOGIC DIAGRAM
(POSITIVE LOGIC)
SN65LVDT14 LOGIC DIAGRAM
(POSITIVE LOGIC)
1Y
1A
1R
1B
1D
1Z
2Y
2A
2R
2B
2D
2Z
3Y
3A
3R
3B
3D
3Z
4Y
4A
4R
4B
4D
4Z
5A
5Y
5D
5Z
5R
5B
Pleasebe aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
Memory Stick is a trademark of Sony.
Serial Peripheral Interface and SPI are trademarks of Motorola.
MultiMediaCard is a trademark of the MultiMediaCard Association.
PRODUCTION DATA information is current as of publication date. Products
conform to specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all parameters.
Copyright 2002, Texas Instruments Incorporated