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SN55LVDS33-SP PDF预览

SN55LVDS33-SP

更新时间： 2024-11-27 11:58:39
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德州仪器 - TI /
页数 文件大小 规格书
20页 252K
描述
HIGH-SPEED DIFFERENTIAL RECEIVER

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SN55LVDS33-SP 技术参数

是否Rohs认证： 符合生命周期：Obsolete
Reach Compliance Code：unknown风险等级：5.72
JESD-30 代码：R-XDFP-F16端子数量：16
最高工作温度：125 °C最低工作温度：-55 °C
最大输出低电流：0.004 A封装主体材料：CERAMIC
封装代码：DFP封装等效代码：FL16,.25
封装形状：RECTANGULAR封装形式：FLATPACK
电源：3.3 V认证状态：Not Qualified
最大接收延迟：8 ns子类别：Line Driver or Receivers
最大压摆率：25 mA标称供电电压：3.3 V
表面贴装：YES技术：CMOS
温度等级：MILITARY端子形式：FLAT
端子节距：1.27 mm端子位置：DUAL
Base Number Matches：1

SN55LVDS33-SP 数据手册

 浏览型号SN55LVDS33-SP的Datasheet PDF文件第2页浏览型号SN55LVDS33-SP的Datasheet PDF文件第3页浏览型号SN55LVDS33-SP的Datasheet PDF文件第4页浏览型号SN55LVDS33-SP的Datasheet PDF文件第5页浏览型号SN55LVDS33-SP的Datasheet PDF文件第6页浏览型号SN55LVDS33-SP的Datasheet PDF文件第7页 
SN55LVDS33-SP  
www.ti.com  
SGLS393C –MARCH 2008–REVISED MARCH 2012  
HIGH-SPEED DIFFERENTIAL RECEIVER  
Check for Samples: SN55LVDS33-SP  
1
FEATURES  
•
400-Mbps Signaling Rate and 200-Mxfr/s Data  
Transfer Rate  
SN55LVDS33W  
(1)  
W PACKAGE  
(TOP VIEW)  
•
•
Operates With a Single 3.3-V Supply  
–4 V to 5 V Common-Mode Input Voltage  
Range  
•
Differential Input Thresholds < ±50 mV With  
50 mV of Hysteresis Over Entire Common-  
Mode Input Voltage Range  
•
•
Complies With TIA/EIA-644 (LVDS)  
Active Failsafe Assures a High-Level Output  
With No Input  
•
•
Bus-Pin ESD Protection Exceeds 15-kV HBM  
Input Remains High-Impedance On Power  
Down  
•
•
•
TTL Inputs Are 5-V Tolerant  
QML-V Qualified, SMD 5962-07248  
Military Temperature Range (–55°C to 125°C)  
(1) The signaling rate of a line is the number of voltage  
transitions that are made per second expressed in the units  
bps (bits per second).  
DESCRIPTION/ORDERING INFORMATION  
These LVDS data line receivers offers the widest common-mode input voltage range in the industry. These  
receivers provide an input voltage range specification compatible with a 5-V PECL signal as well as an overall  
increased ground-noise tolerance. They are in industry standard footprints with integrated termination as an  
option.  
Precise control of the differential input voltage thresholds allows for inclusion of 50 mV of input voltage hysteresis  
to improve noise rejection on slowly changing input signals. The input thresholds are still no more than +50 mV  
over the full input common-mode voltage range.  
The receivers can withstand ±15-kV Human-Body Model (HBM) and ±600-V Machine Model (MM) electrostatic  
discharges to the receiver input pins with respect to ground without damage. This provides reliability in cabled  
and other connections where potentially damaging noise is always a threat.  
The receivers also include a (patent pending) failsafe circuit that provides a high-level output within 600 ns after  
loss of the input signal. The most common causes of signal loss are disconnected cables, shorted lines, or  
powered-down transmitters. The failsafe circuit prevents noise from being received as valid data under these  
fault conditions. This feature may also be used for wired-OR bus signaling. See The Active Failsafe Feature of  
the SN65LVDS32B application note.  
The intended application and signaling technique of these devices is point-to-point baseband data transmission  
over controlled impedance media of approximately 100 Ω. The transmission media may be printed-circuit board  
traces, backplanes, or cables. The ultimate rate and distance of data transfer is dependent upon the attenuation  
characteristics of the media and the noise coupling to the environment.  
The SN55LVDS33 is characterized for operation from –55°C to 125°C.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2008–2012, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
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