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SN55LBC173TDA1 PDF预览

SN55LBC173TDA1

更新时间: 2024-11-24 11:11:31
品牌 Logo 应用领域
德州仪器 - TI 信息通信管理接口集成电路
页数 文件大小 规格书
6页 339K
描述
四路低功耗差分接收器 | TD | 0 | 25 to 25

SN55LBC173TDA1 技术参数

生命周期:Active包装说明:DIE,
Reach Compliance Code:not_compliantECCN代码:EAR99
HTS代码:8542.39.00.01Factory Lead Time:8 weeks
风险等级:5.71Is Samacsys:N
差分输出:NO输入特性:DIFFERENTIAL
接口集成电路类型:LINE RECEIVER接口标准:EIA-422-A; EIA-423-A; EIA-485; CCITT V.11
JESD-30 代码:R-XUUC-N16长度:2.04 mm
功能数量:4端子数量:16
输出特性:3-STATE输出极性:TRUE
封装主体材料:UNSPECIFIED封装代码:DIE
封装形状:RECTANGULAR封装形式:UNCASED CHIP
峰值回流温度(摄氏度):NOT SPECIFIED接收器位数:4
表面贴装:YES技术:BICMOS
端子形式:NO LEAD端子位置:UPPER
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:1.932 mm
Base Number Matches:1

SN55LBC173TDA1 数据手册

 浏览型号SN55LBC173TDA1的Datasheet PDF文件第2页浏览型号SN55LBC173TDA1的Datasheet PDF文件第3页浏览型号SN55LBC173TDA1的Datasheet PDF文件第4页浏览型号SN55LBC173TDA1的Datasheet PDF文件第5页浏览型号SN55LBC173TDA1的Datasheet PDF文件第6页 
SN55LBC173-DIE  
www.ti.com.cn  
ZHCSB71 JUNE 2013  
四路低功耗差动接收器  
查询样品: SN55LBC173-DIE  
1
特性  
2
符合 EIA 标准 RS-422-ARS-423-A,  
RS-485 CCITT V.11  
低功耗  
开电路故障安全设计  
被设计成支持脉冲时长运行  
针对嘈杂环境中的长距离总线线路上的多点总线传  
说明  
SN55LBC173-DIE 是一款具有 3 态输出的单片四路差动线路接收器,此接收器被设计成符合 EIA 标准 RS-422-  
ARS-423-ARS-485 CCITT V.11。 这个器件在数据速率方面针对均衡多点总线传输进行了优化。 4 个接收  
器共用 2 个进行或操作的使能输入,一个在高电平时有效,一个在低电平时有效。 每个接收器特有用来增加抗扰  
度的高输入阻抗、输入滞后。 故障安全设计确保了在输入为开电路时,输出一直为高电平。 SN55LBC173-DIE 使  
用德州仪器 (TI) 已获专利的 LinBiCMOSE™ 技术进行设计,这个技术提供了低功耗、高开关速度和稳健耐用性。  
ORDERING INFORMATION(1)  
PACKAGE  
DESIGNATOR  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
SN55LBC173TDA1  
SN55LBC173TDA2  
100  
10  
SN55LBC173  
TD  
Bare die in waffle pack(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
LinBiCMOSE is a trademark of Texas Instruments.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2013, Texas Instruments Incorporated  
English Data Sheet: SGLS413  

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