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SN54HC08-DIE PDF预览

SN54HC08-DIE

更新时间: 2024-01-08 07:41:15
品牌 Logo 应用领域
德州仪器 - TI 输入元件
页数 文件大小 规格书
5页 75K
描述
RAD-TOLERANT SPACE GRADE DIE, QUADRUPLE 2-INPUT POSITIVE-AND GATES

SN54HC08-DIE 数据手册

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SN54HC08-DIE  
www.ti.com  
SCLS734 JUNE 2013  
RAD-TOLERANT SPACE GRADE DIE, QUADRUPLE 2-INPUT POSITIVE-AND GATES  
Check for Samples: SN54HC08-DIE  
1
FEATURES  
Wide Operating Voltage Range  
Outputs Can Drive Up To 10 LSTTL Loads  
Low Power Consumption  
Typical tpd = 8 ns  
Low Input Current  
DESCRIPTION  
The SN54HC08-DIE device contains four independent 2-input AND gates. Each gate performs the Boolean  
function of Y = A • B or Y = A + B in positive logic.  
ORDERING INFORMATION(1)  
PACKAGE  
DESIGNATOR  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
SN54HC08VTDF1  
SN54HC08VTDF2  
100  
10  
SN54HC08V  
TD  
Bare die in waffle pack(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control  
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature  
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual  
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2013, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
On products compliant to MIL-PRF-38535, all parameters are  
Instruments standard warranty. Production processing does not  
tested unless otherwise noted. On all other products, production  
necessarily include testing of all parameters.  
processing does not necessarily include testing of all parameters.  

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