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SN54BCT8244A

更新时间： 2024-11-03 22:53:39

品牌	Logo	应用领域
德州仪器 - TI		测试
页数	文件大小	规格书
26页	468K
描述
SCAN TEST DEVICES WITH OCTAL BUFFERS

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SN54BCT8244A 数据手册

SN54BCT8244A, SN74BCT8244A

SCAN TEST DEVICES

WITH OCTAL BUFFERS

SCBS042E – FEBRUARY 1990 – REVISED JULY 1996

SN54BCT8244A . . . JT PACKAGE

SN74BCT8244A . . . DW OR NT PACKAGE

(TOP VIEW)

Members of the Texas Instruments

SCOPE Family of Testability Products

Octal Test-Integrated Circuits

1OE

1Y1

1Y2

1Y3

1Y4

GND

2Y1

2Y2

2Y3

2OE

1A1

1A2

1A3

1A4

2A1

Functionally Equivalent to ’F244 and

’BCT244 in the Normal-Function Mode

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

Test Operation Synchronous to Test

Access Port (TAP)

2A2

2A3

Implement Optional Test Reset Signal by

Recognizing a Double-High-Level Voltage

(10 V) on TMS Pin

2Y4 10

TDO

TMS

15 2A4

TDI

TCK

SCOPE Instruction Set

– IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP

and HIGHZ

– Parallel-Signature Analysis at Inputs

– Pseudo-Random Pattern Generation

From Outputs

SN54BCT8244A . . . FK PACKAGE

(TOP VIEW)

– Sample Inputs/Toggle Outputs

1 28 27 26

1A2

1A1

2OE

1OE

1Y1

1Y2

2A4

TDI

TCK

Package Options Include Plastic

Small-Outline (DW) Packages, Ceramic

Chip Carriers (FK), and Standard Plastic

and Ceramic 300-mil DIPs (JT, NT)

22 NC

21 TMS

20 TDO

19 2Y4

description

The ’BCT8244A scan test devices with octal

buffers are members of the Texas Instruments

SCOPE testability integrated-circuit family. This

family of devices supports IEEE Standard

1149.1-1990 boundary scan to facilitate testing of

complex circuit-board assemblies. Scan access

to the test circuitry is accomplished via the 4-wire

test access port (TAP) interface.

12 13 14 15 16 17 18

NC – No internal connection

In the normal mode, these devices are functionally equivalent to the ’F244 and ’BCT244 octal buffers. The test

circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals

or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the

functional operation of the SCOPE octal buffers.

In the test mode, the normal operation of the SCOPE octal buffers is inhibited and the test circuitry is enabled

to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform

boundary-scan test operations, as described in IEEE Standard 1149.1-1990.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE is a trademark of Texas Instruments Incorporated.

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3 4 5 6 7...26

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SN54BCT8244A 替代型号

型号	品牌	替代类型	描述	数据表
SN74BCT8244A	TI	功能相似	SCAN TEST DEVICES WITH OCTAL BUFFERS

与SN54BCT8244A相关器件

型号	品牌	获取价格	描述	数据表
SN54BCT8244A_07	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUFFERS
SN54BCT8244A_08	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUFFERS
SN54BCT8244AFK	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUFFERS
SN54BCT8244AFKR	TI	获取价格	暂无描述
SN54BCT8244AJT	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUFFERS
SN54BCT8245A	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54BCT8245A_08	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54BCT8245AFK	TI	获取价格	BCT/FBT SERIES, 8-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, CQCC28, CERAMIC, CC-28
SN54BCT8245AFKR	TI	获取价格	暂无描述
SN54BCT8245AJT	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

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