SN54ALS1035, SN74ALS1035
HEX NONINVERTING BUFFERS
WITH OPEN-COLLECTOR OUTPUTS
SDAS243B – APRIL 1982 – REVISED AUGUST 2001
SN54ALS1035 . . . J OR W PACKAGE
SN74ALS1035 . . . D OR N PACKAGE
(TOP VIEW)
Noninverting Buffers With
Open-Collector Outputs
description
1A
1Y
2A
2Y
3A
V
CC
1
2
3
4
5
6
7
14
13
12
11
10
9
6A
6Y
5A
5Y
4A
4Y
These devices contain six independent
noninverting buffers. They perform the Boolean
function Y = A. The open-collector outputs require
pullup resistors to perform correctly. They can be
connected to other open-collector outputs to
implement active-low wired-OR or active-high
wired-AND functions. Open-collector devices are
3Y
GND
8
often used to generate higher V
levels.
OH
SN54ALS1035 . . . FK PACKAGE
(TOP VIEW)
3
2
1
20 19
18
2A
NC
2Y
4
5
6
7
8
6Y
NC
5A
NC
5Y
17
16
15
14
NC
3A
9 10 11 12 13
NC – No internal connection
ORDERING INFORMATION
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
†
T
A
PACKAGE
Tube
SN7ALS1035D
SOIC – D
ALS1035
0°C to 70°C
Tape and reel SN7ALS1035DR
PDIP – N
CDIP – J
CFP – W
LCCC - FK
Tube
Tube
Tube
Tube
SN74ALS1035N
SNJ54ALS1035J
SNJ54ALS1035W
SNJ54ALS1035FK
SN74ALS1035N
SNJ54ALS1035J
SNJ54ALS1035W
–55°C to 125°C
SNJ54ALS1035FK
†
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines
are available at www.ti.com/sc/package.
FUNCTION TABLE
(each buffer)
INPUT
A
OUTPUT
Y
H
L
H
L
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 2001, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
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