SN54ABT8952

更新时间： 2024-11-11 23:06:07

品牌	Logo	应用领域
德州仪器 - TI		总线收发器测试
页数	文件大小	规格书
24页	366K
描述
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS

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SN54ABT8952 数据手册

SN54ABT8952, SN74ABT8952

SCAN TEST DEVICES WITH

OCTAL REGISTERED BUS TRANSCEIVERS

SCBS121D – AUGUST 1992 – REVISED JULY 1996

SN54ABT8952 . . . JT PACKAGE

SN74ABT8952 . . . DL OR DW PACKAGE

(TOP VIEW)

Members of the Texas Instruments

SCOPE Family of Testability Products

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port and

Boundary-Scan Architecture

CLKAB

CLKENAB

OEAB

CLKBA

CLKENBA

OEBA

Functionally Equivalent to ’BCT2952 and

’ABT2952 in the Normal-Function Mode

SCOPE Instruction Set

GND

IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP, and

HIGHZ

Parallel-Signature Analysis at Inputs With

Masking Option

A6 10

19 B6

Pseudo-Random Pattern Generation From

Outputs

TDO 13

TMS 14

16 TDI

Sample Inputs/Toggle Outputs

Binary Count From Outputs

Even-Parity Opcodes

15 TCK

SN54ABT8952 . . . FK PACKAGE

(TOP VIEW)

Two Boundary-Scan Cells Per I/O for

Greater Flexibility

State-of-the-Art EPIC-ΙΙB BiCMOS Design

Significantly Reduces Power Dissipation

2 1 28 27 26

Package Options Include Shrink

Small-Outline (DL) and Plastic

Small-Outline (DW) Packages, Ceramic

Chip Carriers (FK), and Standard Ceramic

DIPs (JT)

OEBA

CLKENBA

CLKBA

CLKAB

CLKENAB

OEAB

TDI

TCK

TMS

TDO

description

12 13 14 15 16 17 18

The ’ABT8952 scan test devices with octal

registered bus transceivers are members of the

Texas Instruments SCOPE testability integra-

ted-circuit family. This family of devices supports

IEEE Standard 1149.1-1990 boundary scan to

facilitate testing of complex circuit-board assem-

blies. Scan access to the test circuitry is

accomplished via the 4-wire test access port

(TAP) interface.

In the normal mode, these devices are functionally equivalent to the ’BCT2952 and ’ABT2952 octal registered

bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing

at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does

not affect the functional operation of the SCOPE octal registered bus transceivers.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.

UNLESS OTHERWISE NOTED this document contains PRODUCTION

DATA information current as of publication date. Products conform to

specifications per the terms of Texas Instruments standard warranty.

Production processing does not necessarily include testing of all

parameters.

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3 4 5 6 7...24

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与SN54ABT8952相关器件

型号	品牌	获取价格	描述	数据表
SN54ABT8952_07	TI	获取价格	SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8952FK	TI	获取价格	SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8952JT	TI	获取价格	SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SN54ABT8996	TI	获取价格	10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS
SN54ABT8996_15	TI	获取价格	10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) TAP TRANSCEIVER
SN54ABT8996FK	TI	获取价格	10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS
SN54ABT8996JT	TI	获取价格	10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS
SN54ABT8996W	TI	获取价格	10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 24-CFP
SN54ABTE16245	TI	获取价格	16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
SN54ABTE16245_06	TI	获取价格	16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS

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