生命周期: | Obsolete | 零件包装代码: | DIP |
包装说明: | DIP, DIP24,.3 | 针数: | 24 |
Reach Compliance Code: | unknown | 风险等级: | 5.84 |
其他特性: | WITH DUAL INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION | 控制类型: | INDEPENDENT CONTROL |
计数方向: | BIDIRECTIONAL | 系列: | ABT |
JESD-30 代码: | R-GDIP-T24 | 长度: | 32.005 mm |
负载电容(CL): | 50 pF | 逻辑集成电路类型: | BUS TRANSCEIVER |
最大I(ol): | 0.048 A | 位数: | 9 |
功能数量: | 1 | 端口数量: | 2 |
端子数量: | 24 | 最高工作温度: | 125 °C |
最低工作温度: | -55 °C | 输出特性: | 3-STATE |
输出极性: | TRUE | 封装主体材料: | CERAMIC, GLASS-SEALED |
封装代码: | DIP | 封装等效代码: | DIP24,.3 |
封装形状: | RECTANGULAR | 封装形式: | IN-LINE |
电源: | 5 V | 最大电源电流(ICC): | 38 mA |
Prop。Delay @ Nom-Sup: | 7 ns | 传播延迟(tpd): | 7 ns |
认证状态: | Not Qualified | 座面最大高度: | 5.08 mm |
子类别: | Bus Driver/Transceivers | 最大供电电压 (Vsup): | 5.5 V |
最小供电电压 (Vsup): | 4.5 V | 标称供电电压 (Vsup): | 5 V |
表面贴装: | NO | 技术: | BICMOS |
温度等级: | MILITARY | 端子形式: | THROUGH-HOLE |
端子节距: | 2.54 mm | 端子位置: | DUAL |
翻译: | N/A | 宽度: | 7.62 mm |
Base Number Matches: | 1 |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
SN54ABT8646 | TI |
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SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS | |
SN54ABT8646FK | TI |
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SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | |
SN54ABT8646FKR | TI |
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暂无描述 | |
SN54ABT8646JT | TI |
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SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | |
SN54ABT8652 | TI |
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SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | |
SN54ABT8652_07 | TI |
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SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | |
SN54ABT8652_16 | TI |
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SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | |
SN54ABT8652FK | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | |
SN54ABT8652FKR | TI |
获取价格 |
ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQCC28 | |
SN54ABT8652JT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |