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SN54ABT8543JT PDF预览

SN54ABT8543JT

更新时间： 2024-09-23 22:38:35
品牌 Logo 应用领域
德州仪器 - TI 总线收发器测试
页数 文件大小 规格书
25页 357K
描述
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS

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SN54ABT8543JT 技术参数

是否Rohs认证： 不符合生命周期：Obsolete
零件包装代码：DIP包装说明：DIP, DIP28,.3
针数：28Reach Compliance Code：not_compliant
ECCN代码：3A001.A.2.CHTS代码：8542.39.00.01
风险等级：5.81其他特性：INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION
控制类型：INDEPENDENT CONTROL计数方向：BIDIRECTIONAL
系列：ABTJESD-30 代码：R-GDIP-T28
长度：36.83 mm负载电容（CL）：50 pF
逻辑集成电路类型：BOUNDARY SCAN REG BUS TRANSCEIVER最大I（ol）：0.048 A
位数：8功能数量：1
端口数量：2端子数量：28
最高工作温度：125 °C最低工作温度：-55 °C
输出特性：3-STATE输出极性：TRUE
封装主体材料：CERAMIC, GLASS-SEALED封装代码：DIP
封装等效代码：DIP28,.3封装形状：RECTANGULAR
封装形式：IN-LINE峰值回流温度（摄氏度）：NOT SPECIFIED
电源：5 V最大电源电流（ICC）：38 mA
Prop。Delay @ Nom-Sup：5.8 ns传播延迟（tpd）：7.3 ns
认证状态：Not Qualified座面最大高度：5.08 mm
子类别：Bus Driver/Transceivers最大供电电压 (Vsup)：5.5 V
最小供电电压 (Vsup)：4.5 V标称供电电压 (Vsup)：5 V
表面贴装：NO技术：BICMOS
温度等级：MILITARY端子形式：THROUGH-HOLE
端子节距：2.54 mm端子位置：DUAL
处于峰值回流温度下的最长时间：NOT SPECIFIED翻译：N/A
宽度：7.62 mmBase Number Matches：1

SN54ABT8543JT 数据手册

 浏览型号SN54ABT8543JT的Datasheet PDF文件第2页浏览型号SN54ABT8543JT的Datasheet PDF文件第3页浏览型号SN54ABT8543JT的Datasheet PDF文件第4页浏览型号SN54ABT8543JT的Datasheet PDF文件第5页浏览型号SN54ABT8543JT的Datasheet PDF文件第6页浏览型号SN54ABT8543JT的Datasheet PDF文件第7页 
SN54ABT8543, SN74ABT8543  
SCAN TEST DEVICES WITH  
OCTAL REGISTERED BUS TRANSCEIVERS  
SCBS120E – AUGUST 1991 – REVISED JULY 1996  
SN54ABT8543 . . . JT PACKAGE  
SN74ABT8543 . . . DL OR DW PACKAGE  
(TOP VIEW)  
Members of the Texas Instruments  
SCOPE Family of Testability Products  
Compatible With the IEEE Standard  
1149.1-1990 (JTAG) Test Access Port and  
Boundary-Scan Architecture  
LEAB  
CEAB  
OEAB  
A1  
A2  
A3  
GND  
A4  
A5  
LEBA  
CEBA  
OEBA  
B1  
B2  
B3  
1
2
3
4
5
6
7
8
9
28  
27  
26  
25  
24  
23  
22  
21  
20  
Functionally Equivalent to ’F543 and  
’ABT543 in the Normal-Function Mode  
SCOPE Instruction Set  
– IEEE Standard 1149.1-1990 Required  
Instructions, Optional INTEST, CLAMP,  
and HIGHZ  
– Parallel-Signature Analysis at Inputs  
With Masking Option  
– Pseudo-Random Pattern Generation  
From Outputs  
– Sample Inputs/Toggle Outputs  
– Binary Count From Outputs  
– Even-Parity Opcodes  
B4  
V
CC  
B5  
A6 10  
19 B6  
A7  
A8  
B7  
B8  
11  
12  
18  
17  
TDO 13  
TMS 14  
16 TDI  
15 TCK  
Two Boundary-Scan Cells Per I/O for  
Greater Flexibility  
SN54ABT8543 . . . FK PACKAGE  
(TOP VIEW)  
State-of-the-Art EPIC-ΙΙB BiCMOS Design  
Significantly Reduces Power Dissipation  
Package Options Include Plastic  
Small-Outline (DW) and Shrink  
Small-Outline (DL) Packages, Ceramic Chip  
Carriers (FK), and Standard Ceramic  
DIPs (JT)  
4
3
2 1 28 27 26  
5
25 B7  
OEBA  
CEBA  
LEBA  
LEAB  
CEAB  
OEAB  
A1  
6
B8  
24  
23  
22  
21  
20  
19  
7
TDI  
TCK  
TMS  
TDO  
A8  
8
9
description  
10  
11  
The ’ABT8543 scan test devices with octal  
registered bus transceivers are members of the  
1213 14 15 16 17 18  
Texas  
Instruments  
SCOPE  
testability  
integrated-circuit family. This family of devices  
supports IEEE Standard 1149.1-1990 boundary  
scan to facilitate testing of complex circuit-board  
assemblies. Scan access to the test circuitry is  
accomplished via the 4-wire test access port  
(TAP) interface.  
In the normal mode, these devices are functionally equivalent to the ’F543 and ’ABT543 octal registered bus  
transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at  
the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not  
affect the functional operation of the SCOPE octal registered bus transceivers.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.  
Copyright 1996, Texas Instruments Incorporated  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...25

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