Datasheet > SN54ABT8245_06

SN54ABT8245_06

更新时间： 2024-09-24 05:18:23

品牌	Logo	应用领域
德州仪器 - TI		总线收发器测试
页数	文件大小	规格书
28页	483K
描述
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS

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SN54ABT8245_06 数据手册

SN54ABT8245, SN74ABT8245

SCAN TEST DEVICES

WITH OCTAL BUS TRANSCEIVERS

SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996

SN54ABT8245 . . . JT PACKAGE

SN74ABT8245 . . . DW PACKAGE

(TOP VIEW)

Members of the Texas Instruments

SCOPE Family of Testability Products

Compatible With the IEEE Standard

1149.1-1990 (JTAG) Test Access Port

and Boundary-Scan Architecture

DIR

Functionally Equivalent to ’F245 and

’ABT245 in the Normal-Function Mode

21 A3

20 A4

19 A5

GND

TDO

TMS

SCOPE Instruction Set:

– IEEE Standard 1149.1-1990 Required

Instructions, Optional INTEST, CLAMP,

and HIGHZ

– Parallel-Signature Analysis at Inputs

With Masking Option

TDI

TCK

– Pseudo-Random Pattern Generation

From Outputs

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Even-Parity Opcodes

SN54ABT8245 . . . FK PACKAGE

(TOP VIEW)

Two Boundary-Scan Cells per I/O for

Greater Flexibility

State-of-the-Art EPIC-ΙΙB BiCMOS Design

Significantly Reduces Power Dissipation

2 1 28 27 26

Package Options Include Plastic

Small-Outline Packages (DW), Ceramic

Chip Carriers(FK), and Standard Ceramic

DIPs (JT)

TDI

TCK

DIR

TMS

TDO

description

12 13 14 15 16 17 18

The ’ABT8245 scan test devices with octal bus

transceivers are members of the Texas Instru-

ments SCOPE

testability integrated-circuit

family. This family of devices supports IEEE

Standard 1149.1-1990 boundary scan to facilitate

testing of complex circuit-board assemblies. Scan

access to the test circuitry is accomplished via the

4-wire test access port (TAP) interface.

NC – No internal connection

In the normal mode, these devices are functionally equivalent to the ’F245 and ’ABT245 octal bus transceivers.

The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins

or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the

functional operation of the SCOPE octal bus transceivers.

Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is

allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The

output-enable (OE) input can be used to disable the device so that the buses are effectively isolated.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3 4 5 6 7...28

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与SN54ABT8245_06相关器件

型号	品牌	获取价格	描述	数据表
SN54ABT8245_07	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245_08	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245FK	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245JT	TI	获取价格	SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT827	TI	获取价格	10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN54ABT827_16	TI	获取价格	10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN54ABT827FK	TI	获取价格	10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN54ABT827JT	TI	获取价格	10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN54ABT833	TI	获取价格	8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS
SN54ABT833_15	TI	获取价格	8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS

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