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SM320C6202GJLA20EP PDF预览

SM320C6202GJLA20EP

更新时间: 2024-01-24 04:12:24
品牌 Logo 应用领域
德州仪器 - TI 数字信号处理器
页数 文件大小 规格书
83页 1179K
描述
FIXED-POINT DIGITAL SIGNAL PROCESSOR

SM320C6202GJLA20EP 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:BGA
包装说明:BGA, BGA352,26X26,40针数:352
Reach Compliance Code:not_compliantECCN代码:3A001.A.3
HTS代码:8542.31.00.01风险等级:5.9
其他特性:ALSO REQUIRES 3.3V SUPPLY地址总线宽度:22
桶式移位器:NO位大小:32
边界扫描:YES最大时钟频率:62.5 MHz
外部数据总线宽度:32格式:FIXED POINT
内部总线架构:MULTIPLEJESD-30 代码:S-PBGA-B352
JESD-609代码:e0长度:27 mm
低功率模式:YES湿度敏感等级:4
端子数量:352最高工作温度:105 °C
最低工作温度:-40 °C封装主体材料:PLASTIC/EPOXY
封装代码:BGA封装等效代码:BGA352,26X26,40
封装形状:SQUARE封装形式:GRID ARRAY
峰值回流温度(摄氏度):220电源:1.8,3.3 V
认证状态:Not QualifiedRAM(字数):131072
座面最大高度:3.8 mm子类别:Digital Signal Processors
最大供电电压:1.89 V最小供电电压:1.71 V
标称供电电压:1.8 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:27 mm
uPs/uCs/外围集成电路类型:DIGITAL SIGNAL PROCESSOR, OTHERBase Number Matches:1

SM320C6202GJLA20EP 数据手册

 浏览型号SM320C6202GJLA20EP的Datasheet PDF文件第2页浏览型号SM320C6202GJLA20EP的Datasheet PDF文件第3页浏览型号SM320C6202GJLA20EP的Datasheet PDF文件第4页浏览型号SM320C6202GJLA20EP的Datasheet PDF文件第5页浏览型号SM320C6202GJLA20EP的Datasheet PDF文件第6页浏览型号SM320C6202GJLA20EP的Datasheet PDF文件第7页 
ꢀꢁ ꢂ ꢃ ꢄ ꢅꢆ ꢃꢄ ꢃꢇ ꢈꢉ  
ꢊ ꢋꢌ ꢈꢍꢇꢉꢎ ꢋ ꢏꢐ ꢍꢋ ꢑꢋ ꢐꢒꢓ ꢀꢋ ꢑ ꢏꢒꢓ ꢉꢔ ꢎ ꢅꢈ ꢀ ꢀꢎ ꢔ  
SGUS044−JULY 2003  
D
Controlled Baseline  
− One Assembly/Test Site, One Fabrication  
Site  
D
3M-Bit On-Chip SRAM  
− 2M-Bit Internal Program/Cache  
(64K 32-Bit Instructions)  
− 1M-Bit Dual-Access Internal Data  
(128K Bytes)  
D
D
Extended Temperature Performance of  
−40°C to 105°C  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
− Organized as Two 64K-Byte Blocks for  
Improved Concurrency  
D
D
32-Bit External Memory Interface (EMIF)  
− Glueless Interface to Synchronous  
Memories: SDRAM or SBSRAM  
− Glueless Interface to Asynchronous  
Memories: SRAM and EPROM  
− 52M-Byte Addressable External Memory  
Space  
D
D
D
Enhanced Product-Change Notification  
Qualification Pedigree  
High-Performance Fixed-Point Digital  
Signal Processors (DSPs)−SM320C62x  
− 5-ns Instruction Cycle Time  
− 200-MHz Clock Rate  
− Eight 32-Bit Instructions/Cycle  
− 1600 MIPS  
32-Bit Expansion Bus (XBus)  
− Glueless/Low-Glue Interface to Popular  
PCI Bridge Chips  
− Glueless/Low-Glue Interface to Popular  
Synchronous or Asynchronous  
Microprocessor Buses  
− Master/Slave Functionality  
− Glueless Interface to Synchronous FIFOs  
and Asynchronous Peripherals  
D
D
VelociTIAdvanced Very-Long-Instruction-  
Word (VLIW) C62xDSP Core  
− Eight Highly Independent Functional  
Units:  
− Six ALUs (32-/40-Bit)  
− Two 16-Bit Multipliers (32-Bit Result)  
− Load-Store Architecture With 32 32-Bit  
General-Purpose Registers  
− Instruction Packing Reduces Code Size  
− All Instructions Conditional  
D
Three Multichannel Buffered Serial Ports  
(McBSPs)  
− Direct Interface to T1/E1, MVIP, SCSA  
Framers  
− ST-Bus-Switching Compatible  
− Up to 256 Channels Each  
− AC97-Compatible  
Instruction Set Features  
− Byte-Addressable (8-, 16-, 32-Bit Data)  
− 8-Bit Overflow Protection  
− Saturation  
− Bit-Field Extract, Set, Clear  
− Bit-Counting  
− Normalization  
− Serial-Peripheral Interface (SPI)  
Compatible (Motorola)  
Two 32-Bit General-Purpose Timers  
D
D
D
D
Four-Channel Bootloading  
Direct-Memory-Access (DMA) Controller  
With an Auxiliary Channel  
IEEE-1149.1 (JTAG )  
Boundary-Scan-Compatible  
D
352-Pin BGA Package (GJL)  
Flexible Phase-Locked-Loop (PLL) Clock  
Generator  
D
0.18-µm/5-Level Metal Process  
− CMOS Technology  
D
3.3-V I/Os, 1.8-V Internal  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
SM320C62x, VelociTI, and C62x are trademarks of Texas Instruments.  
Motorola is a trademark of Motorola, Inc.  
Other trademarks are the property of their respective owners.  
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range.  
This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST,  
electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this  
component beyond specified performance and environmental limits.  
IEEE Standard 1149.1-1990 Standard-Test-Access Port and Boundary Scan Architecture.  
ꢐꢡ  
Copyright 2003, Texas Instruments Incorporated  
ꢝ ꢡ ꢞ ꢝꢖ ꢗꢫ ꢙꢘ ꢜ ꢤꢤ ꢢꢜ ꢚ ꢜ ꢛ ꢡ ꢝ ꢡ ꢚ ꢞ ꢦ  
1
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  

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