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SCANH162512ASMX/NOPB PDF预览

SCANH162512ASMX/NOPB

更新时间: 2024-11-21 19:47:39
品牌 Logo 应用领域
德州仪器 - TI 输出元件逻辑集成电路触发器
页数 文件大小 规格书
12页 193K
描述
SCAN/JTAG/3J SERIES, DUAL 8-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, PBGA64

SCANH162512ASMX/NOPB 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:LFBGA, BGA64,8X8,32Reach Compliance Code:compliant
风险等级:5.84控制类型:INDEPENDENT CONTROL
计数方向:BIDIRECTIONAL系列:SCAN/JTAG/3J
JESD-30 代码:S-PBGA-B64JESD-609代码:e1
长度:8 mm负载电容(CL):30 pF
逻辑集成电路类型:BOUNDARY SCAN BUS TRANSCEIVER最大I(ol):0.012 A
湿度敏感等级:4位数:8
功能数量:2端口数量:2
端子数量:64最高工作温度:85 °C
最低工作温度:-40 °C输出特性:3-STATE WITH SERIES RESISTOR
输出极性:TRUE封装主体材料:PLASTIC/EPOXY
封装代码:LFBGA封装等效代码:BGA64,8X8,32
封装形状:SQUARE封装形式:GRID ARRAY, LOW PROFILE, FINE PITCH
包装方法:TAPE AND REEL峰值回流温度(摄氏度):260
电源:3/3.3 VProp。Delay @ Nom-Sup:6 ns
传播延迟(tpd):6.5 ns认证状态:Not Qualified
座面最大高度:1.5 mm子类别:Bus Driver/Transceivers
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):2.7 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Silver/Copper (Sn/Ag/Cu)端子形式:BALL
端子节距:0.8 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED翻译:N/A
触发器类型:POSITIVE EDGE宽度:8 mm
Base Number Matches:1

SCANH162512ASMX/NOPB 数据手册

 浏览型号SCANH162512ASMX/NOPB的Datasheet PDF文件第2页浏览型号SCANH162512ASMX/NOPB的Datasheet PDF文件第3页浏览型号SCANH162512ASMX/NOPB的Datasheet PDF文件第4页浏览型号SCANH162512ASMX/NOPB的Datasheet PDF文件第5页浏览型号SCANH162512ASMX/NOPB的Datasheet PDF文件第6页浏览型号SCANH162512ASMX/NOPB的Datasheet PDF文件第7页 
February 2004  
SCAN16512A  
Low Voltage Universal 16-bit IEEE 1149.1 Bus  
Transceiver with TRI-STATE Outputs  
General Description  
Features  
n IEEE 1149.1 (JTAG) Compliant  
n 2.7V to 3.6V VCC Operation  
The SCAN16512A is a high speed, low-power universal bus  
transceiver featuring data inputs organized into two 8-bit  
bytes with output enable and latch enable control signals.  
This function is configurable as a D-type Latch or Flip-Flop,  
and can operate in transparent, latched, or clocked mode.  
This device is compliant with IEEE 1149.1 Standard Test  
Access Port and Boundary Scan Architecture with the incor-  
poration of the defined boundary-scan test logic and test  
access port consisting of Test Data Input (TDI), Test Data  
Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and  
Test Reset (TRST).  
n TRI-STATE outputs for bus-oriented applications  
n Dual byte-wide data for bus applications  
n Power down high Impedance inputs and outputs  
n Optional Bus Hold on data inputs eliminates the need  
for external pullup/pulldown resistors (SCANH16512A,  
SCANH162512A versions)  
n Optional 25series resistors in outputs to minimize  
noise and eliminate termination resistors  
(SCAN162512A, SCANH162512A versions)  
n Supports live insertion/withdrawal  
n Includes CLAMP and HIGHZ instructions  
Block Diagram  
20075302  
© 2004 National Semiconductor Corporation  
DS200753  
www.national.com  

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