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SCAN92LV090VEH/NOPB PDF预览

SCAN92LV090VEH/NOPB

更新时间: 2024-01-26 11:41:39
品牌 Logo 应用领域
德州仪器 - TI 驱动接口集成电路驱动器
页数 文件大小 规格书
22页 881K
描述
具有边界扫描功能的 9 通道总线 LVDS 收发器 | PM | 64 | -40 to 85

SCAN92LV090VEH/NOPB 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:QFP
包装说明:LFQFP, QFP64,.47SQ,20针数:64
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01Factory Lead Time:1 week
风险等级:1.81差分输出:YES
驱动器位数:9高电平输入电流最大值:0.00002 A
输入特性:DIFFERENTIAL SCHMITT TRIGGER接口集成电路类型:LINE TRANSCEIVER
接口标准:IEEE 1149.1JESD-30 代码:S-PQFP-G64
JESD-609代码:e3长度:10 mm
湿度敏感等级:3功能数量:9
端子数量:64最高工作温度:85 °C
最低工作温度:-40 °C最大输出低电流:0.002 A
封装主体材料:PLASTIC/EPOXY封装代码:LFQFP
封装等效代码:QFP64,.47SQ,20封装形状:SQUARE
封装形式:FLATPACK, LOW PROFILE, FINE PITCH峰值回流温度(摄氏度):260
电源:3.3 V认证状态:Not Qualified
最大接收延迟:3.9 ns接收器位数:9
座面最大高度:1.6 mm子类别:Line Driver or Receivers
最大压摆率:210 mA最大供电电压:3.6 V
最小供电电压:3 V标称供电电压:3.3 V
电源电压1-最大:3.6 V电源电压1-分钟:3 V
电源电压1-Nom:3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Matte Tin (Sn)端子形式:GULL WING
端子节距:0.5 mm端子位置:QUAD
处于峰值回流温度下的最长时间:NOT SPECIFIED最大传输延迟:2.6 ns
宽度:10 mmBase Number Matches:1

SCAN92LV090VEH/NOPB 数据手册

 浏览型号SCAN92LV090VEH/NOPB的Datasheet PDF文件第2页浏览型号SCAN92LV090VEH/NOPB的Datasheet PDF文件第3页浏览型号SCAN92LV090VEH/NOPB的Datasheet PDF文件第4页浏览型号SCAN92LV090VEH/NOPB的Datasheet PDF文件第5页浏览型号SCAN92LV090VEH/NOPB的Datasheet PDF文件第6页浏览型号SCAN92LV090VEH/NOPB的Datasheet PDF文件第7页 
SCAN92LV090  
www.ti.com  
SNLS058I SEPTEMBER 2000REVISED APRIL 2013  
SCAN92LV090 9 Channel Bus LVDS Transceiver w/ Boundary SCAN  
Check for Samples: SCAN92LV090  
1
FEATURES  
DESCRIPTION  
The SCAN92LV090A is one in a series of Bus LVDS  
transceivers designed specifically for the high speed,  
low power proprietary backplane or cable interfaces.  
The device operates from a single 3.3V power supply  
and includes nine differential line drivers and nine  
receivers. To minimize bus loading, the driver outputs  
and receiver inputs are internally connected. The  
separate I/O of the logic side allows for loop back  
support. The device also features a flow through pin  
out which allows easy PCB routing for short stubs  
between its pins and the connector.  
2
IEEE 1149.1 (JTAG) Compliant  
Bus LVDS Signaling  
Low Power CMOS Design  
High Signaling Rate Capability (Above 100  
Mbps)  
0.1V to 2.3V Common Mode Range for VID  
200mV  
=
±100 mV Receiver Sensitivity  
Supports Open and Terminated Failsafe on  
Port Pins  
The driver translates 3V TTL levels (single-ended) to  
differential Bus LVDS (BLVDS) output levels. This  
allows for high speed operation, while consuming  
minimal power with reduced EMI. In addition, the  
differential signaling provides common mode noise  
rejection of ±1V.  
3.3V Operation  
Glitch Free Power Up/Down (Driver & Receiver  
Disabled)  
Light Bus Loading (5 pF Typical) per Bus  
LVDS Load  
The receiver threshold is less than ±100 mV over a  
±1V common mode range and translates the  
differential Bus LVDS to standard (TTL/CMOS)  
levels.  
Designed for Double Termination Applications  
Balanced Output Impedance  
Product Offered in 64 Pin LQFP Package and  
NFBGA Package  
This device is compliant with IEEE 1149.1 Standard  
Test Access Port and Boundary Scan Architecture  
with the incorporation of the defined boundary-scan  
test logic and test access port consisting of Test Data  
Input (TDI), Test Data Out (TDO), Test Mode Select  
(TMS), Test Clock (TCK), and the optional Test Reset  
(TRST).  
High Impedance Bus Pins on Power Off (VCC  
0V)  
=
SIMPLIFIED FUNCTIONAL DIAGRAM  
D0+/RI+  
BLVDS I/O  
D0-/RI-  
D
D
IN  
DE  
R
R
OUT  
RE  
Channel 1 of 9  
Common to all  
data channels  
TDI  
TDO  
IEEE 1149.1 (JTAG)  
Test Access Port  
TCK  
TMS  
TRST  
Figure 1.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
All trademarks are the property of their respective owners.  
2
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2000–2013, Texas Instruments Incorporated  

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