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S10200-02-01_15 PDF预览

S10200-02-01_15

更新时间: 2022-02-26 14:32:16
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HAMAMATSU /
页数 文件大小 规格书
14页 855K
描述
TDI-CCD image sensors

S10200-02-01_15 数据手册

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TDI-CCD image sensors  
S10200-02-01 S10201-04-01 S10202-08-01 S10202-16-01  
Operating the back-thinned CCD in TDI mode  
delivers high sensitivity.  
TDI-CCD image sensers capture clear and bright images even under low-light-level conditions. During TDI (time delay integra-  
tion) mode, the CCD captures an image of a moving object while transferring integrated signal charges synchronously with  
the object movement. This operation mode dramatically boosts sensitivity to high levels even when capturing fast moving  
objects. Our new TDI-CCD uses the back-thinned structure to achieve even higher quantum efciency over a wide spectral  
range from UV to near IR region (200 to 1100 nm).  
Features  
Applications  
TDI mode gives high sensitivity  
Sequential imaging of high-speed moving samples  
Inspection tasks on electronic parts production line  
Semiconductor inspection  
High-speed, continuous image acquisition  
Back-thinned structure ensures high sensitivity from UV to near IR  
Multiple ports for high-speed line rate  
Low noise  
Flow cytometery  
TDI mode  
In FFT-CCD, signal charges in each line are vertically transferred during charge readout. TDI mode synchronizes this vertical  
transfer timing with the movement of the object, so that signal charges are integrated a number of times equal to the number  
of vertical stages of the CCD pixels. In the TDI mode, the signal charges must be transferred in the same direction at the same  
speed as those of the object to be imaged. These speeds are expressed by the following equation:  
v = f × d  
v: object moving speed, charge transfer speed, f: vertical transfer frequency, d: pixel size  
In the right gure, when the rst stage charges are transferred  
Schematic diagram showing integrated  
to the second stage, an additional charges are produced in the  
second stage by photoelectric conversion and accumulated.  
When this operation is continuously repeated until reaching  
the last stage M (the number of vertical stages), signal charg-  
es which are M times greater than the initial charges are accu-  
mulated. Since the signal charges on each line are output from  
the CCD horizontal shift register, a two-dimensional image can  
be continuously acquired. In this way the TDI mode achieves  
sensitivity which is M times higher than linear image sensors  
exposure by TDI mode  
Time1  
Time2  
Time3  
First stage  
·
·
·
·
·
Last stage M  
KMPDC0139EA  
(S/N is improved M times). The TDI mode also improves  
sensitivity variations compared to frame mode operation.  
Selection guide  
Number of  
total pixels  
(H × V)  
1040 × 128  
2080 × 128  
4160 × 128  
4224 × 128  
Number of  
effective pixels  
(H × V)  
1024 × 128  
2048 × 128  
4096 × 128  
4096 × 128  
1
Number of  
ports  
Pixel rate  
(MHz/port)  
Line rate  
(kHz)  
Vertical  
transfer  
Applicable  
camera  
*
Type no.  
2 3  
S10200-02-01  
S10201-04-01  
S10202-08-01  
S10202-16-01  
2
4
8
-
* *  
2 3  
50  
C10000-801  
* *  
30  
Bi-directional  
-
-
16  
100  
1: The C10000 series cameras are products manufactured by Hamamatsu Photonics, System Division (refer to page 14).  
2: Temporary window type (S10200-02N-01, S10201-04N-01) is also available upon request.  
3: Light-shield mask type (S10200-02M-01, S10201-04M-01) for horizontal register shielding is also available upon request [see device  
structure (P.7)]. The light-shield mask’s aperture size in the vertical direction is 96 pixels. The effect of the light-shield mask may  
vary depending on the wavelength of the light source in use and the incident angle of light.  
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www.hamamatsu.com  

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