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RT3PE3000L-1FG484B PDF预览

RT3PE3000L-1FG484B

更新时间: 2022-12-18 02:36:03
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ACTEL 闪存
页数 文件大小 规格书
144页 4788K
描述
Radiation-Tolerant ProASIC3 Low-Power Space- Flight Flash FPGAs

RT3PE3000L-1FG484B 数据手册

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Advance v0.1  
®
Radiation-Tolerant ProASIC3 Low-Power Space-  
Flight Flash FPGAs  
with Flash*Freeze Technology  
• High-Performance, Low-Skew Global Network  
• Architecture Supports Ultra-High Utilization  
Features and Benefits  
MIL-STD-883 Class B Qualified Packaging  
• Ceramic Column Grid Array with Six Sigma Copper-  
Wrapped Lead-Tin Columns  
Advanced and Pro (Professional) I/Os  
• 700 Mbps DDR, LVDS-Capable I/Os  
• 1.2 V, 1.5 V, 1.8 V, 2.5 V, and 3.3 V Mixed-Voltage  
• Land Grid Array  
Operation  
Low Power  
• Bank-Selectable I/O Voltages—up to 8 Banks per Chip  
• Dramatic Reduction in Dynamic and Static Power  
• Single-Ended I/O Standards: LVTTL, LVCMOS 3.3 V /  
2.5 V / 1.8 V / 1.5 V / 1.2 V, 3.3 V PCI / 3.3 V PCI-X, and  
LVCMOS 2.5 V / 5.0 V Input  
• 1.2 V to 1.5 V Core and I/O Voltage Support for Low  
Power  
• Low Power Consumption in Flash*Freeze Mode Enables  
• Differential I/O Standards: LVPECL, LVDS, B-LVDS, and M-LVDS  
Instantaneous Entry To  
Flash*Freeze Mode  
/
Exit From Low-Power  
• Voltage-Referenced I/O Standards: GTL+ 2.5 V / 3.3 V, GTL  
2.5 V / 3.3 V, HSTL Class I and II, SSTL2 Class I and II, SSTL3  
Class I and II (RT3PE3000L only)  
• I/O Registers on Input, Output, and Enable Paths  
• Hot-Swappable and Cold-Sparing I/Os  
• Programmable Output Slew Rate and Drive Strength  
• Programmable Input Delay (RT3PE3000L only)  
• Supports Single-Voltage System Operation  
• Low-Impedance Switches  
Radiation Tolerant  
• 15 krad Total Ionizing Dose (TID)  
• Wafer-Lot-Specific TID Reports  
High Capacity  
• Schmitt Trigger Option on Single-Ended Inputs  
• 600 k to 3 M System Gates  
• Up to 504 kbits of True Dual-Port SRAM  
• Up to 620 User I/Os  
(RT3PE3000L)  
• Weak Pull-Up/-Down  
• IEEE 1149.1 (JTAG) Boundary Scan Test  
Reprogrammable Flash Technology  
• 130-nm, 7-Layer Metal (6 Copper), Flash-Based CMOS  
Process  
• Live-at-Power-Up (LAPU) Level 0 Support  
• Single-Chip Solution  
• Pin-Compatible Packages across the Radiation-Tolerant  
ProASIC®3 Family  
Clock Conditioning Circuit (CCC) and PLL  
• Six CCC Blocks, All with Integrated PLL (RT ProASIC3)  
• Configurable Phase Shift, Multiply/Divide, Delay  
• Retains Programmed Design when Powered Off  
Capabilities, and External Feedback  
• Wide Input Frequency Range 1.5 MHz to 250 MHz (1.2 V  
systems) and 350 MHz (1.5 V systems)  
High Performance  
• 350 MHz (1.5 V) and 250 MHz (1.2 V) System Performance  
• 3.3 V, 66 MHz, 66-Bit PCI (1.5 V); 66 MHz, 32-Bit PCI (1.2 V)  
SRAMs and FIFOs  
• Variable-Aspect-Ratio 4,608-Bit RAM Blocks (×1, ×2, ×4,  
×9, and ×18 organizations available)  
In-System Programming (ISP) and Security  
• Secure ISP Using On-Chip 128-Bit Advanced Encryption  
Standard (AES) Decryption via JTAG (IEEE 1532–compliant)  
• True Dual-Port SRAM (except ×18)  
• 24 SRAM and FIFO Blocks with Synchronous Operation:  
– 250 MHz: For 1.2 V Systems  
• FlashLock® to Secure FPGA Contents  
High-Performance Routing Hierarchy  
– 350 MHz: For 1.5 V Systems  
• Segmented, Hierarchical Routing and Clock Structure  
Table I-1 • Radiation-Tolerant (RT) ProASIC3 Low-Power Space-Flight FPGAs  
RT ProASIC3 Devices  
System Gates  
RT3PE600L  
RT3PE3000L  
600 k  
13,824  
108  
24  
3 M  
75,264  
504  
112  
1 k  
VersaTiles (D-flip-flops)  
RAM kbits (1,024 bits)  
4,608-Bit Blocks  
FlashROM Bits  
1 k  
Yes  
6
Yes  
6
Secure (AES) ISP  
Integrated PLL in CCCs  
VersaNet Globals  
I/O Banks  
18  
18  
8
8
Maximum User I/Os  
270  
620  
Package Pins  
CCGA/LGA  
CG/LG484  
CG/LG484, CG/LG896  
September 2008  
I
© 2008 Actel Corporation  

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