RFM products are now
Murata products.
RP1298
•
•
•
•
•
Ideal for 433.92 MHz Superhet Receiver LOs
Nominal Insertion Phase Shift of 180° at Resonance
Quartz Stability
423.22 MHz
SAW Resonator
Rugged, Hermetic, Low-Profile TO39 Case
Pb
Complies with Directive 2002/95/EC (RoHS)
The RP1298 is a two-port, 180° surface-acoustic-wave (SAW) resonator in a low-profile TO39
case. It provides reliable, fundamental-mode, quartz frequency stabilization of local oscillators
operating at approximately 423.22 MHz. The RP1298 is designed for 433.92 MHz superhet
receivers in remote-control and wireless security applications operating in Europe under ETSI I-
ETS 300 220 and in Germany under FTZ 17 TR 2100.
Absolute Maximum Ratings
Rating
Value
Units
TO39-3 Case
CW RF Power Dissipation (See: Typical Test Circuit)
DC Voltage Between Any Two Pins (Observe ESD Precautions)
Case Temperature
+0
dBm
VDC
°C
±30
-40 to +85
Characteristic
Sym
Notes
Minimum
Typical
Maximum
Units
MHz
Center Frequency
fC
Absolute Frequency
423.120
423.320
2, 3, 4, 5,
ΔfC
IL
Tolerance from 423.220 MHz
±100
8.0
kHz
dB
Insertion Loss
Quality Factor
2, 5, 6
5, 6, 7
5.2
QU
QL
TO
fO
Unloaded Q
15,200
50 Ω Loaded Q
6,900
39
Temperature Stability
Turnover Temperature
Turnover Frequency
Frequency Temp. Coefficient
Absolute Value during First Year
24
1.0
2.2
54
°C
fC+2.6
0.037
≤ 10
6, 7, 8
kHz
ppm/°C2
ppm/yr
FTC
|fA|
Frequency Aging
6
5
DC Insulation Resistance between Any Two Pins
MΩ
Ω
RF Equivalent RLC
RM
LM
CM
CO
Motional Resistance
Motional Inductance
Motional Capacitance
Shunt Static Capacitance
82
152
2.8
5, 7, 9
5, 6, 9
475.283
0.297547
2.5
µH
fF
pF
Lid Symbolization (in addition to Lot and/or Date Codes)
RFM P1298
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
NOTES:
1.
2.
Frequency aging is the change in f with time and is specified at +65°C or less. Aging may exceed the specification for prolonged temperatures above +65°C. Typically,
C
aging is greatest the first year after manufacture, decreasing significantly in subsequent years.
The frequency f is the frequency of minimum IL with the resonator in the specified test fixture in a 50 Ω test system with VSWR ≤ 1.2:1. Typically, f
or
OSCILLATOR
C
f
is less than the resonator f .
TRANSMITTER
C
3.
4.
5.
One or more of the following United States patents apply: 4,454,488; 4,616,197.
Typically, equipment utilizing this device requires emissions testing and government approval, which is the responsibility of the equipment manufacturer.
Unless noted otherwise, case temperature T = +25°C± 5°C
C
6.
7.
The design, manufacturing process, and specifications of this device are subject to change without notice.
Derived mathematically from one or more of the following directly measured parameters: f , IL, 3 dB bandwidth, f versus T , and C .
C
C
C
O
8.
Turnover temperature, T , is the temperature of maximum (or turnover) frequency, f . The nominal frequency at any case temperature, T , may be calculated from: f =
O
O
C
2
f
[1 - FTC (T - T ) ]. Typically, oscillator T is 20° less than the specified resonator T .
O C O O
O
9.
This equivalent RLC model approximates resonator performance near the resonant frequency and is provided for reference only. The capacitance C is the measured
O
static (nonmotional) capacitance between either pin 1 and ground or pin 2 and ground. The measurement includes case parasitic capacitance.
©2010-2015 by Murata Electronics N.A., Inc.
RP1298 (R) 2/12/15
Page 1 of 2
www.murata.com