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RN2106CT PDF预览

RN2106CT

更新时间: 2024-01-26 02:55:38
品牌 Logo 应用领域
东芝 - TOSHIBA 驱动器开关
页数 文件大小 规格书
8页 195K
描述
Switching Applications Inverter Circuit Applications Interface Circuit Applications Driver Circuit Applications

RN2106CT 数据手册

 浏览型号RN2106CT的Datasheet PDF文件第2页浏览型号RN2106CT的Datasheet PDF文件第3页浏览型号RN2106CT的Datasheet PDF文件第4页浏览型号RN2106CT的Datasheet PDF文件第5页浏览型号RN2106CT的Datasheet PDF文件第6页浏览型号RN2106CT的Datasheet PDF文件第7页 
RN2101CT ~ RN2106CT  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)  
RN2101CT,RN2102CT,RN2103CT  
RN2104CT,RN2105CT,RN2106CT  
Switching Applications  
Unit: mm  
Inverter Circuit Applications  
0.6±0.05  
0.5±0.03  
Interface Circuit Applications  
Driver Circuit Applications  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enable the manufacture of ever more  
compact equipment and save assembly cost.  
Complementary to RN1101CT to RN1106CT  
0.05±0.03  
0.35±0.02  
0.15±0.03  
Equivalent Circuit and Bias Resistor Values  
C
Type No.  
R1 (kΩ)  
R2 (kΩ)  
1.BASE  
RN2101CT  
RN2102CT  
RN2103CT  
RN2104CT  
RN2105CT  
RN2106CT  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
2.EMITTER  
3.COLLECOTR  
CST3  
R1  
B
22  
JEDEC  
JEITA  
47  
E
2.2  
4.7  
TOSHIBA  
2-1J1A  
Weight: 0.75 mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
Collector-base voltage  
RN2101CT to 2106CT  
Collector-emitter voltage  
V
V
20  
20  
10  
5  
V
V
CBO  
CEO  
RN2101CT to 2104CT  
Emitter-base voltage  
V
V
EBO  
RN2105CT, 2106CT  
Collector current  
I
50  
50  
mA  
mW  
°C  
C
Collector power dissipation  
RN2101CT to 2106CT  
Junction temperature  
P
C
T
150  
j
Storage temperature range  
T
stg  
55 to 150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e.operatingtemperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2009-04-17  

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