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RN1971CT(TE85L)

更新时间: 2024-09-23 21:12:35
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体管
页数 文件大小 规格书
6页 139K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,20V V(BR)CEO,50MA I(C),LLCC

RN1971CT(TE85L) 技术参数

生命周期:Active包装说明:,
Reach Compliance Code:unknown风险等级:5.8
最大集电极电流 (IC):0.05 A最小直流电流增益 (hFE):300
元件数量:2极性/信道类型:PNP
最大功率耗散 (Abs):0.14 W子类别:BIP General Purpose Small Signal
表面贴装:YES晶体管元件材料:SILICON
Base Number Matches:1

RN1971CT(TE85L) 数据手册

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RN1970CT, RN1971CT  
TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Bias Resistor built-in Transistor)  
RN1970CT,RN1971CT  
Switching, Inverter Circuit, Interface Circuit and  
Unit: mm  
Driver Circuit Applications  
1.0±0.05  
0.15±0.03  
Two devices are incorporated into a fine pitch Small Mold (6 pin)  
package.  
Incorporating a bias resistor into a transistor reduces parts count.  
Reducing the parts count enable the manufacture of ever more  
compact equipment and save assembly cost.  
Complementary to RN2970CT, RN2971CT  
0.35±0.02  
0.35±0.02  
0.075±0.03  
0.7±0.03  
Equivalent Circuit  
C
1.EMITTER1  
2.EMITTER2  
3.BASE2  
4.COLLECTOR2  
5.BASE1  
R1  
B
CST6  
6.COLLECTOR1  
JEDEC  
E
JEITA  
TOSHIBA  
2-1K1A  
Weight:1.0mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common)  
Equivalent Circuit  
(top view)  
Characteristics  
Collector-base voltage  
Symbol  
Rating  
Unit  
6
5
4
V
CBO  
V
CEO  
V
EBO  
20  
V
V
Q2  
Q1  
Collector-emitter voltage  
Emitter-base voltage  
20  
5
50  
V
1
2
3
Collector current  
I
mA  
mW  
°C  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
140  
C(Note1)  
T
j
150  
T
stg  
55 to 150  
Note1: Total rating  
Note:  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage  
and the significant change in temperature, etc.) may cause this product to decrease  
in the reliability significantly even if the operating conditions  
(i.e.operatingtemperature/current/voltage, etc.) are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual  
reliability data (i.e. reliability test report and estimated failure rate, etc).  
1
2009-06-15  

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