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RN1710(TE85L) PDF预览

RN1710(TE85L)

更新时间: 2024-11-01 19:38:39
品牌 Logo 应用领域
东芝 - TOSHIBA 开关光电二极管晶体管
页数 文件大小 规格书
6页 279K
描述
TRANSISTOR 100 mA, 50 V, 2 CHANNEL, NPN, Si, SMALL SIGNAL TRANSISTOR, USV, 2-2L1A, 5 PIN, BIP General Purpose Small Signal

RN1710(TE85L) 技术参数

生命周期:Obsolete包装说明:SMALL OUTLINE, R-PDSO-G5
针数:5Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8541.21.00.75
风险等级:5.76其他特性:BUILT-IN BIAS RESISTOR
最大集电极电流 (IC):0.1 A集电极-发射极最大电压:50 V
配置:COMMON EMITTER, 2 ELEMENTS WITH BUILT-IN RESISTOR最小直流电流增益 (hFE):120
JESD-30 代码:R-PDSO-G5元件数量:2
端子数量:5封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
极性/信道类型:NPN认证状态:Not Qualified
表面贴装:YES端子形式:GULL WING
端子位置:DUAL晶体管应用:SWITCHING
晶体管元件材料:SILICON标称过渡频率 (fT):250 MHz
Base Number Matches:1

RN1710(TE85L) 数据手册

 浏览型号RN1710(TE85L)的Datasheet PDF文件第2页浏览型号RN1710(TE85L)的Datasheet PDF文件第3页浏览型号RN1710(TE85L)的Datasheet PDF文件第4页浏览型号RN1710(TE85L)的Datasheet PDF文件第5页浏览型号RN1710(TE85L)的Datasheet PDF文件第6页 
RN1710,RN1711  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)  
RN1710,RN1711  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
Unit: mm  
z Including two devices in USV (ultra super mini type with 5 leads)  
z With built-in bias resistors  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN2710 and RN2711  
Equivalent Circuit  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common)  
USV  
Characterisstic  
Collector-base voltage  
Symbol  
Rating  
Unit  
JEDEC  
V
CBO  
V
CEO  
V
EBO  
50  
50  
V
V
JEITA  
Collector-emitter voltage  
Emitter-base voltage  
TOSHIBA  
22L1A  
5
V
Weight: 6.2 mg (typ.)  
Collector current  
I
100  
mA  
mW  
°C  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P *  
C
200  
T
j
150  
Equivalent Circuit  
(Top View)  
T
stg  
55 to150  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in temperature,  
etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.)  
are within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba  
Semiconductor Reliability Handbook (“Handling Precautions”/“Derating  
Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
*: Total rating  
1
2010-05-21  

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