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RN1602(TE85L,F) PDF预览

RN1602(TE85L,F)

更新时间: 2024-11-19 19:47:27
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体管
页数 文件大小 规格书
7页 510K
描述
PRE-BIASED "DIGITAL" TRANSISTOR,50V V(BR)CEO,100MA I(C),TSOP

RN1602(TE85L,F) 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:,Reach Compliance Code:unknown
风险等级:5.77最大集电极电流 (IC):0.1 A
最小直流电流增益 (hFE):50元件数量:2
极性/信道类型:NPN最大功率耗散 (Abs):0.3 W
子类别:BIP General Purpose Small Signal表面贴装:YES
晶体管元件材料:SILICONBase Number Matches:1

RN1602(TE85L,F) 数据手册

 浏览型号RN1602(TE85L,F)的Datasheet PDF文件第2页浏览型号RN1602(TE85L,F)的Datasheet PDF文件第3页浏览型号RN1602(TE85L,F)的Datasheet PDF文件第4页浏览型号RN1602(TE85L,F)的Datasheet PDF文件第5页浏览型号RN1602(TE85L,F)的Datasheet PDF文件第6页浏览型号RN1602(TE85L,F)的Datasheet PDF文件第7页 
RN1601~RN1606  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)  
RN1601, RN1602, RN1603  
RN1604, RN1605, RN1606  
Unit: mm  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
z Including two devices in SM6 (super-mini-type with six (6) leads)  
z With built-in bias resistors  
z Simplified circuit design  
z Reduced number of parts and manufacturing process  
z Complementary to RN2601 to RN2606  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN1601  
RN1602  
RN1603  
RN1604  
RN1605  
RN1606  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
22  
SM6  
47  
JEDEC  
2.2  
4.7  
JEITA  
TOSHIBA  
Weight: 15mg (typ.)  
2-3N1A  
Equivalent Circuit  
(Top View)  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN1601 to 1606  
Collector-emitter voltage  
RN1601 to 1604  
RN1605, 1606  
10  
Emitter-base voltage  
V
V
EBO  
5
Collector current  
I
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P *  
C
300  
RN1601 to 1606  
T
150  
j
T
stg  
55 to150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
*Total rating  
Start of commercial production  
1988-11  
2014-03-01  
1

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