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RN1602(TE85L) PDF预览

RN1602(TE85L)

更新时间: 2024-11-20 08:24:27
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
7页 474K
描述
TRANSISTOR 100 mA, 50 V, 2 CHANNEL, NPN, Si, SMALL SIGNAL TRANSISTOR, SM6, 2-3N1A, 6 PIN, BIP General Purpose Small Signal

RN1602(TE85L) 数据手册

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RN1601~RN1606  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) (Bias Resistor built-in Transistor)  
RN1601, RN1602, RN1603  
RN1604, RN1605, RN1606  
Unit: mm  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
z Including two devices in SM6 (super-mini-type with six (6) leads)  
z With built-in bias resistors  
z Simplified circuit design  
z Reduced number of parts and manufacturing process  
z Complementary to RN2601 to RN2606  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN1601  
RN1602  
RN1603  
RN1604  
RN1605  
RN1606  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
22  
SM6  
47  
JEDEC  
2.2  
4.7  
JEITA  
TOSHIBA  
Weight: 15mg (typ.)  
2-3N1A  
Equivalent Circuit  
(Top View)  
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN1601 to 1606  
Collector-emitter voltage  
RN1601 to 1604  
RN1605, 1606  
10  
Emitter-base voltage  
V
V
EBO  
5
Collector current  
I
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P *  
C
300  
RN1601 to 1606  
T
150  
j
T
stg  
55 to150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
*Total rating  
2010-05-19  
1

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