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RN1313(TE85R) PDF预览

RN1313(TE85R)

更新时间: 2024-11-16 15:49:47
品牌 Logo 应用领域
东芝 - TOSHIBA 开关光电二极管晶体管
页数 文件大小 规格书
5页 282K
描述
TRANSISTOR 100 mA, 50 V, NPN, Si, SMALL SIGNAL TRANSISTOR, USM, 2-2E1A, SC-70, 3 PIN, BIP General Purpose Small Signal

RN1313(TE85R) 技术参数

生命周期:Obsolete零件包装代码:SC-70
包装说明:SMALL OUTLINE, R-PDSO-G3针数:3
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8541.21.00.75风险等级:5.76
其他特性:BUILT-IN BIAS RESISTOR最大集电极电流 (IC):0.1 A
集电极-发射极最大电压:50 V配置:SINGLE WITH BUILT-IN RESISTOR
最小直流电流增益 (hFE):120JESD-30 代码:R-PDSO-G3
元件数量:1端子数量:3
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:SMALL OUTLINE极性/信道类型:NPN
认证状态:Not Qualified表面贴装:YES
端子形式:GULL WING端子位置:DUAL
晶体管应用:SWITCHING晶体管元件材料:SILICON
标称过渡频率 (fT):250 MHzBase Number Matches:1

RN1313(TE85R) 数据手册

 浏览型号RN1313(TE85R)的Datasheet PDF文件第2页浏览型号RN1313(TE85R)的Datasheet PDF文件第3页浏览型号RN1313(TE85R)的Datasheet PDF文件第4页浏览型号RN1313(TE85R)的Datasheet PDF文件第5页 
RN1312,RN1313  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
RN1312,RN1313  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
z With built-in bias resistors  
Unit: mm  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN2312, RN2313  
Equivalent Circuit  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
CBO  
V
CEO  
V
EBO  
50  
50  
V
V
JEDEC  
Collector-emitter voltage  
Emitter-base voltage  
Collector current  
JEITA  
SC-70  
5
V
TOSHIBA  
2-2E1A  
I
100  
mA  
mA  
mW  
°C  
°C  
Weight: 0.006g (typ.)  
C
Base current  
I
100  
B
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
150  
C
T
j
125  
T
stg  
55~125  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Electrical Characteristics (Ta = 25°C)  
Test  
Circuit  
Characteristic  
Symbol  
Test Condition  
= 50V, I = 0  
Min  
Typ.  
Max  
Unit  
Collector cut-off current  
Emitter cut-off current  
I
V
V
V
100  
100  
700  
0.3  
nA  
nA  
CBO  
CB  
EB  
CE  
E
I
= 5V, I = 0  
C
EBO  
DC current gain  
h
= 5V, I = 1mA  
120  
FE  
C
Collector-emitter saturation voltage  
Transition frequency  
V
I
= 5mA, I = 0.25mA  
C B  
0.1  
250  
3
V
CE (sat)  
f
V
V
= 10V, I = 5mA  
MHz  
pF  
T
CE  
C
Collector output capacitance  
C
= 10V, I = 0, f = 1MHz  
CB E  
6
ob  
RN1312  
Input resistor  
15.4  
32.9  
22  
47  
28.6  
61.1  
R1  
kΩ  
RN1313  
1
2007-11-01  

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