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RN1305TE85LF PDF预览

RN1305TE85LF

更新时间: 2022-02-26 12:30:23
品牌 Logo 应用领域
东芝 - TOSHIBA PC
页数 文件大小 规格书
8页 462K
描述
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)

RN1305TE85LF 数据手册

 浏览型号RN1305TE85LF的Datasheet PDF文件第2页浏览型号RN1305TE85LF的Datasheet PDF文件第3页浏览型号RN1305TE85LF的Datasheet PDF文件第4页浏览型号RN1305TE85LF的Datasheet PDF文件第5页浏览型号RN1305TE85LF的Datasheet PDF文件第6页浏览型号RN1305TE85LF的Datasheet PDF文件第7页 
RN1301~RN1306  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
RN1301,RN1302,RN1303  
RN1304,RN1305,RN1306  
Unit: mm  
Switching, Inverter Circuit, Interface Circuit  
and Driver Circuit Applications  
z With built-in bias resistors.  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN2301 to RN2306  
Equivalent Circuit and Bias Resistor Values  
Type No.  
R1 (k)  
R2 (k)  
RN1301  
RN1302  
RN1303  
RN1304  
RN1305  
RN1306  
4.7  
10  
4.7  
10  
22  
47  
47  
47  
22  
47  
USM  
2.2  
4.7  
JEDEC  
JEITA  
SC-70  
TOSHIBA  
Weight: 6 mg (typ.)  
2-2E1A  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Collector-base voltage  
Symbol  
Rating  
Unit  
V
V
50  
50  
V
V
CBO  
CEO  
RN1301 to 1306  
Collector-emitter voltage  
RN1301 to 1304  
RN1305, 1306  
10  
Emitter-base voltage  
V
V
EBO  
5
Collector current  
I
100  
100  
150  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
P
C
RN1301 to 1306  
T
j
T
stg  
55 to 150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2010-04-06  

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