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RN1115MFV PDF预览

RN1115MFV

更新时间: 2024-11-11 20:11:11
品牌 Logo 应用领域
东芝 - TOSHIBA 开关光电二极管晶体管
页数 文件大小 规格书
8页 169K
描述
TRANSISTOR 100 mA, 50 V, NPN, Si, SMALL SIGNAL TRANSISTOR, VESM, 2-1L1A, 3 PIN, BIP General Purpose Small Signal

RN1115MFV 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:SMALL OUTLINE, R-PDSO-F3针数:3
Reach Compliance Code:unknownECCN代码:EAR99
风险等级:5.72其他特性:BUILT-IN BIAS RESISTOR RATIO IS 4.55
最大集电极电流 (IC):0.1 A集电极-发射极最大电压:50 V
配置:SINGLE WITH BUILT-IN RESISTOR最小直流电流增益 (hFE):50
JESD-30 代码:R-PDSO-F3元件数量:1
端子数量:3封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:NPN
认证状态:Not Qualified表面贴装:YES
端子形式:FLAT端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:SWITCHING
晶体管元件材料:SILICON标称过渡频率 (fT):250 MHz
Base Number Matches:1

RN1115MFV 数据手册

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RN1114MFVRN1118MFV  
TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process)  
RN1114MFV,RN1115MFV,RN1116MFV,RN1117MFV,RN1118MFV  
Switching Applications  
Inverter Circuit Applications  
Interface Circuit Applications  
Unit: mm  
Driver Circuit Applications  
1.2 ± 0.05  
z With built-in bias resistors  
0.80 ± 0.05  
z Simplify circuit design  
z Reduce a quantity of parts and manufacturing process  
z Complementary to RN2114MFV to RN2118MFV  
1
3
2
Equivalent Circuit and Bias Resister Values  
Type No.  
R1 (k)  
R2 (k)  
RN1114MFV  
RN1115MFV  
RN1116MFV  
RN1117MFV  
RN1118MFV  
1
10  
10  
10  
4.7  
10  
1.BASE  
2.2  
4.7  
10  
47  
2.EMITTER  
3.COLLECTOR  
VESM  
JEDEC  
JEITA  
TOSHIBA  
2-1L1A  
Weight: 1.5 mg (typ.)  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
Rating  
Unit  
Collector-base voltage  
Collector-emitter voltage  
RN1114MFV  
to 1118MFV  
V
50  
V
V
Land Pattern Example  
CBO  
V
50  
CEO  
RN1114MFV  
RN1115MFV  
RN1116MFV  
RN1117MFV  
RN1118MFV  
5
0.5mm  
6
7
0.45mm  
Emitter-base voltage  
V
V
EBO  
15  
0.45mm  
25  
0.4mm  
Collector current  
I
100  
mA  
mW  
°C  
C
Collector power dissipation  
Junction temperature  
Storage temperature range  
RN1114MFV  
to 111M8FV  
P
(Note 1)  
150  
C
T
150  
j
T
stg  
55 to 150  
°C  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Mounted on FR4 board (25.4 mm × 25.4 mm × 1.6 mm)  
1
2010-04-06  

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