®
RF1172B
•
•
•
Ideal Front-End Filter for European Wireless Receivers
Low-Loss, Coupled-Resonator Quartz Design
Simple External Impedance Matching
Surface-Mount Ceramic Case with 52 mm2 Footprint
Complies with Directive 2002/95/EC (RoHS)
433.92 MHz
SAW Filter
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•
The RF1172B is a low-loss, compact, and economical surface-acoustic-wave (SAW) filter designed to pro-
vide front-end selectivity in 433.92 MHz receivers. Receiver designs using this filter include superhet with
10.7 MHz or 500 kHz IF, direct conversion and superregen. Typical applications of these receivers are wire-
less remote-control and security devices operating in Europe under ETSI I-ETS 300 220.
This coupled-resonator filter (CRF) uses selective null placement to provide suppression, typically greater
than 40 dB, of the LO and image spurious responses of superhet receivers with 10.7 MHz IF. RFM’s ad-
vanced SAW design and fabrication technology is utilized to achieve high performance and very low loss with
simple external impedance matching (not included). Our new patent pending solder seal process utilizes a
Faraday shield lid, which improves out of band rejection.
SM8558-8 Case
Electrical Characteristics
Characteristic
Absolute Frequency
Sym
Notes
Minimum
Typical
Maximum
Units
f
Center Frequency at 25°C
433.92
MHz
kHz
c
1, 2
Df
±80
5.0
Tolerance from 433.92 MHz
C
Insertion Loss
3 dB Bandwidth
Rejection
IL
1
3.0
600
50
dB
BW
1, 2
kHz
500
40
800
3
at f - 21.4 MHz (Image)
c
at f - 10.7 MHz (LO)
1
dB
15
30
80
c
Ultimate
T
Temperature
Operating Case Temp.
Turnover Temperature
Turnover Frequency
-40
15
+85
35
°C
°C
C
T
25
O
3, 4
f
f
MHz
ppm/°C
O
c
2
FTC
Freq. Temp. Coefficient
Absolute Value during the First Year
Series Inductance
0.032
£10
47
Frequency Aging
|fA|
L
5
1
ppm/yr
nH
External Impedance
C
pF
11
Shunt Capacitance
Lid Symbolization (in addition to Lot and/or Date Codes)
RFM RF1172B
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Notes:
1. Unless noted otherwise, all measurements are made with the filter installed in the specified test fixture which is connected to a 50 W test system with
VSWR £ 1.2:1. The test fixture L and C are adjusted for minimum insertion loss at the filter center frequency, f . Note that insertion loss and band-
c
width are dependent on the impedance matching component values and quality.
2. The frequency f is defined as the midpoint between the 3dB frequencies.
c
3. Where noted, specifications apply over the entire specified operating temperature range.
4. The turnover temperature, T , is the temperature of maximum (or turnover) frequency, f . The nominal frequency at any case temperature, T , may
O
o
c
2
be calculated from: f = f [1 - FTC (T - T ) ].
o
o
c
5. Frequency aging is the change in fc with time and is specified at +65°C or less. Aging may exceed the specification for prolonged temperatures
above +65°C. Typically, aging is greatest the first year after manufacture, decreasing significantly in subsequent years.
6. The design, manufacturing process, and specifications of this device are subject to change without notice.
7. One or more of the following U.S. Patents apply: 4,54,488, 4,616,197, and others pending.
8. All equipment designs utilizing this product must be approved by the appropriate government agency prior to manufacture or sale.
RF Monolithics, Inc.
RFM Europe
Phone: (972) 233-2903
Phone: 44 1963 251383
Fax: (972) 387-8148
Fax: 44 1963 251510
E-mail: info@rfm.com
http://www.rfm.com
RF1172B-030102
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©1999 by RF Monolithics, Inc. The stylized RFM logo are registered trademarks of RF Monolithics, Inc.