Phototransistors
PNZ150 (PN150)
Silicon planar type
Unit: mm
4.5±±.3
4.2±±.3
(2.3) (1.9)
For optical control systems
φ3.5±±.2
■ Features
• High sensitivity
• Wide spectral sensitivity characteristics, suited for detecting GaAs
LEDs
2-±.98±±.2
2-±.45±±.15
• Low dark current
• Side-view plastic mold type package
±.45±±.15
(2.54)
(1.2)
■ Absolute Maximum Ratings Ta = 25°C
(R1.75)
Parameter
Symbol
Rating
20
Unit
V
Collector-emitter voltage (Base open) VCEO
Collector current
IC
20
mA
mW
°C
1: Emitter
2: Collector
LSTLR102-003 Package
1
2
Collector power dissipation
Operating ambient temperature
Storage temperature
PC
100
Topr
Tstg
−25 to +85
−30 to +100
°C
■ Electrical-Optical Characteristics Ta = 25°C 3°C
Parameter
Symbol
ICE(L)
ICEO
λp
Conditions
VCE = 10 V, L = 500 lx
VCE = 10 V
Min
Typ
3.0
Max
Unit
mA
µA
nm
°
1
Photocurrent *
1.0
Dark current
0.01
800
35
1.00
Peak emission wavelength
Half-power angle
VCE = 10 V
θ
The angle from which photocurrent
becomes 50%
2
Rise time *
tr
tf
VCC = 10 V, ICE(L) = 5 mA, RL = 100 Ω
4
4
µs
µs
V
2
Fall time *
1
Collector-emitter saturation voltage *
VCE(sat) ICE(L) = 1 mA, L = 1000 lx
0.2
0.5
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
2. Spectral sensitivity characteristics: Sensitivity for wave length over 400 nm maximum sensitivity ratio is 100%.
3. This device is designed be dis regarded radiation.
4. 1: Source: Tungsten (color temperature 2856 K)
*
2: Switching time measurement circuit
*
Sig. in
VCC
tr: Rise time
tf: Fall time
(Input pulse)
90%
10%
Sig. out
(Output pulse)
50 Ω
RL
tr
tf
Note) The part number in the parenthesis shows conventional part number.
Publication date: April 2004
SHE00018BED
1