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OPA627-DIE PDF预览

OPA627-DIE

更新时间: 2024-11-24 01:14:03
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德州仪器 - TI /
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6页 110K
描述
OPA627-DIE Precision High-Speed DIFET Operational Amplifier

OPA627-DIE 数据手册

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OPA627-DIE  
SBOS717 JULY 2014  
OPA627-DIE Precision High-Speed DIFET Operational Amplifier  
1 Features  
3 Description  
The OPA627-DIE DIFET operational amplifier  
provides a new level of performance in a precision  
FET operational amplifier. The OPA627-DIE has low  
noise, low offset voltage, and high speed. It is useful  
in a broad range of precision and high-speed analog  
circuitry.  
1
Very-Low Noise  
Unity-Gain Stable  
2 Applications  
Precision Instrumentation  
Fast Data Acquisition  
DAC Output Amplifier  
Optoelectronics  
The OPA627-DIE is fabricated on a high-speed,  
dielectrically-isolated  
process. It operates over a wide range of power  
supply voltage. Laser-trimmed DIFET input circuitry  
provides high accuracy and low-noise performance  
comparable with the best bipolar-input operational  
amplifiers.  
complementary  
NPN/PNP  
Sonar, Ultrasound  
High-Impedance Sensor Amplifiers  
High-Performance Audio Circuitry  
Active Filters  
High frequency complementary transistors allow  
increased circuit bandwidth, attaining dynamic  
performance not possible with previous precision FET  
operational amplifiers. The OPA627-DIE is unity-gain  
stable and is stable in gains equal to or greater than  
five.  
DIFET fabrication achieves extremely-low input bias  
currents without compromising input voltage noise  
performance. Low input bias current is maintained  
over a wide input common-mode voltage range with  
unique cascode circuitry.  
Ordering Information(1)  
PACKAGE  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
DESIGNATOR  
OPA627TDB1  
OPA627TDB2  
130  
10  
OPA627  
TD  
Bare die in waffle pack(2)  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  

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