OPA314
OPA2314
OPA4314
www.ti.com
SBOS563D –MAY 2011–REVISED MARCH 2012
3-MHz, Low-Power, Low-Noise, RRIO, 1.8-V CMOS
OPERATIONAL AMPLIFIER
Check for Samples: OPA314, OPA2314, OPA4314
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FEATURES
DESCRIPTION
The OPA314 family of single-, dual-, and quad-
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Low IQ: 150 µA/ch
channel operational amplifiers represents a new
generation of low-power, general-purpose CMOS
amplifiers. Rail-to-rail input and output swings, low
quiescent current (150 μA typ at 5.0 VS) combined
with a wide bandwidth of 3 MHz, and very low noise
(14 nV/√Hz at 1 kHz) make this family very attractive
for a variety of battery-powered applications that
Wide Supply Range: 1.8 V to 5.5 V
Low Noise: 14 nV/√Hz at 1 kHz
Gain Bandwidth: 3 MHz
Low Input Bias Current: 0.2 pA
Low Offset Voltage: 0.5 mV
Unity-Gain Stable
require
a
good balance between cost and
performance. The low input bias current supports
applications with mega-ohm source impedances.
Internal RF/EMI Filter
Extended Temperature Range:
–40°C to +125°C
The robust design of the OPA314 devices provides
ease-of-use to the circuit designer: unity-gain stability
with capacitive loads of up to 300 pF, an integrated
RF/EMI rejection filter, no phase reversal in overdrive
conditions, and high electrostatic discharge (ESD)
protection (4-kV HBM).
APPLICATIONS
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Battery-Powered Instruments:
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Consumer, Industrial, Medical
Notebooks, Portable Media Players
These devices are optimized for low-voltage
operation as low as +1.8 V (±0.9 V) and up to +5.5 V
(±2.75 V), and are specified over the full extended
temperature range of –40°C to +125°C.
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Photodiode Amplifiers
Active Filters
Remote Sensing
The OPA314 (single) is available in both SC70-5 and
SOT23-5 packages. The OPA2314 (dual) is offered in
SO-8, MSOP-8, and DFN-8 packages. The quad-
channel OPA4314 is offered in a TSSOP-14 package.
Wireless Metering
Handheld Test Equipment
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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