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OPA2277-DIE PDF预览

OPA2277-DIE

更新时间: 2024-11-26 11:45:59
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德州仪器 - TI 运算放大器
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4页 166K
描述
HIGH-PRECISION OPERATIONAL AMPLIFIER

OPA2277-DIE 数据手册

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OPA2277-DIE  
www.ti.com  
SBOS611 MARCH 2012  
HIGH-PRECISION OPERATIONAL AMPLIFIER  
Check for Samples: OPA2277-DIE  
1
FEATURES  
Ultra Low Offset Voltage  
APPLICATIONS  
Ultra Low Drift  
Transducer Amplifier  
Bridge Amplifier  
High Open-Loop Gain  
High Common-Mode Rejection  
High Power Supply Rejection  
Low Bias Current  
Temperature Measurements  
Strain Gage Amplifier  
Precision Integrator  
Battery Powered Instruments  
Test Equipment  
Wide Supply Range: ±2V to ±18V  
Low Quiescent Current  
DESCRIPTION  
The OPA2277 precision op amp replaces the industry standard OP-177. It offers improved noise, wider output  
voltage swing, and are twice as fast with half the quiescent current. Features include ultra low offset voltage and  
drift, low bias current, high common-mode rejection, and high power supply rejection.  
The OPA2277 op amp operates from ±2V to ±18V supplies with excellent performance. Unlike most op amps  
which are specified at only one supply voltage, the OPA2277 is specified for real-world applications; a single limit  
applies over the ±5V to ±15V supply range. High performance is maintained as the amplifiers swing to their  
specified limits.  
The OPA2277 op amp is easy to use and free from phase inversion and overload problems found in some other  
op amps. It is stable in unity gain and provides excellent dynamic behavior over a wide range of load conditions.  
The dual version features completely independent circuitry for lowest crosstalk and freedom from interaction,  
even when overdriven or overloaded.  
ORDERING INFORMATION(1)  
PACKAGE  
DESIGNATOR  
PRODUCT  
PACKAGE  
ORDERABLE PART NUMBER  
PACKAGE QUANTITY  
OPA2277TDD1  
OPA2277TDD2  
252  
10  
Bare Die In Waffle  
Pack(2)  
OPA2277  
TD  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality  
Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room  
temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not  
warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2012, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

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