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OED4205-19.20M PDF预览

OED4205-19.20M

更新时间: 2024-11-21 21:12:47
品牌 Logo 应用领域
PLETRONICS 机械振荡器
页数 文件大小 规格书
6页 93K
描述
CMOS Output Clock Oscillator, 19.2MHz Nom, ROHS COMPLIANT, CERAMIC, LCC-8

OED4205-19.20M 技术参数

是否Rohs认证: 符合生命周期:Active
Reach Compliance Code:compliant风险等级:5.6
其他特性:TAPE AND REEL老化:1 PPM/ONE YEAR
最大控制电压:2.5 V最小控制电压:0.5 V
最长下降时间:6.5 ns频率调整-机械:NO
频率偏移/牵引率:10 ppm频率稳定性:0.05%
JESD-609代码:e4安装特点:SURFACE MOUNT
标称工作频率:19.2 MHz最高工作温度:70 °C
最低工作温度:振荡器类型:CMOS
输出负载:10 KOHM, 10 pF物理尺寸:5.0mm x 3.2mm x 1.5mm
最长上升时间:6.5 ns最大供电电压:3.47 V
最小供电电压:3.13 V标称供电电压:3.3 V
表面贴装:YES最大对称度:60/40 %
端子面层:Gold (Au) - with Nickel (Ni) barrierBase Number Matches:1

OED4205-19.20M 数据手册

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OeD4205-19.20M  
TCVCXO Oscillator  
November 2010  
• Pletronics’ OeD4 is from the OeXO™ Series of  
temperature compensated voltage controlled  
crystal oscillator with a CMOS output.  
• 3.2 x 5 mm LCC Ceramic Package  
• Supply Voltage: 3.3V  
• Cut Tape -or- Tape and Reel packaging  
Pletronics Inc. certifies this device is in accordance with the  
RoHS 6/6 (2002/95/EC) and WEEE (2002/96/EC) directives.  
Pletronics Inc. guarantees the device does not contain the following:  
Cadmium, Hexavalent Chromium, Lead, Mercury, PBB’s, PBDE’s  
Weight of the Device: 0.10 grams  
Moisture Sensitivity Level: 1 As defined in J-STD-020D.1  
Second Level Interconnect code: e4  
Absolute Maximum Ratings:  
Parameter  
Unit  
VCC Supply Voltage  
Vi Input Voltage  
Vo Output Voltage  
-0.5V to +6.5V  
-0.5V to VCC + 0.5V  
-0.5V to VCC + 0.5V  
Thermal Characteristics  
The maximum die or junction temperature is 155oC  
The thermal resistance junction to board is 30 to 50oC/Watt depending on the solder pads, ground plane  
and construction of the PCB.  
ESD Rating  
Model  
Minimum Voltage  
Conditions  
Human Body Model  
Charged Device Model  
1500  
1000  
MIL-STD-883 Method 3115  
JESD 22-C101  
Product information is current as of publication date. The product conforms  
to specifications per the terms of the Pletronics standard warranty. Production  
processsing does not necessarily include testing of all parameters.  
Copyright © 2010, Pletronics Inc.  

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