NUP3115UPMU
Transient Voltage
Suppressors
Low Capacitance ESD Protection for
High Speed Data
http://onsemi.com
The three−line voltage transient suppressor array is designed to protect
voltage−sensitive components that require ultra−low capacitance from
ESD and transient voltage events. This device features a common anode
D
1
D
2
D
3
V
CC
design which protects three independent high speed data lines and a V
CC
power line in a single six−lead UDFN low profile package.
Excellent clamping capability, low capacitance, low leakage, and fast
response time make these parts ideal for ESD protection on designs
where board space is at a premium. Because of its low capacitance, it is
suited for use in high frequency designs such as a USB 2.0 high speed.
6.8V
16V
Features
• Low Capacitance 0.8 pF
• UDFN Package, 1.6 x 1.6 mm
• Low Profile of 0.50 mm for Ultra Slim Design
• Stand Off Voltage: 5.5 V
• Low Leakage
MARKING
DIAGRAM
1
UDFN6 1.6x1.6
MU SUFFIX
CASE 517AP
6
P3 MG
G
• Protects up to Three Data Lines Plus a V Pin
1
CC
• V Pin = 15 V Protection
CC
P3
M
G
= Specific Device Code
= Date Code
= Pb−Free Package
• D , D , and D Pins = 6.4 V Minimum Protection
1
2
3
• IEC61000−4−2: Level 4 ESD Protection
• This is a Pb−Free Device
(Note: Microdot may be in either location)
Typical Applications
• USB 2.0 High−Speed Interface
• Cell Phones
PIN CONNECTIONS
6
5
4
V
CC
D
1
D
2
D
3
1
2
3
• MP3 Players
GND
NC
NC
• SIM Card Protection
MAXIMUM RATINGS (T = 25°C, unless otherwise specified)
J
Symbol
Rating
Value
Unit
I
Peak Pulse Current
V
Diode
5.0
A
PK
CC
ORDERING INFORMATION
8x20 msec double exponential waveform
Operating Junction Temperature Range
Storage Temperature Range
†
Device
Package
Shipping
T
T
T
−40 to 125
−55 to 150
260
°C
°C
°C
J
NUP3115UPMUTAG UDFN6 3000/Tape & Reel
STG
L
(Pb−Free)
Lead Solder Temperature – Maximum
(10 seconds)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
ESD
IEC 61000−4−2 Contact
8000
V
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
See Application Note AND8308/D for further description of
survivability specs.
©
Semiconductor Components Industries, LLC, 2009
1
Publication Order Number:
September, 2009− Rev. 1
NUP3115UPMU/D