NSS40401LT1G
40 V, 8.0 A, Low VCE(sat)
NPN Transistor
2
ON Semiconductor’s e PowerEdge family of low V
CE(sat)
transistors are miniature surface mount devices featuring ultra low
saturation voltage (V ) and high current gain capability. These
CE(sat)
are designed for use in low voltage, high speed switching applications
where affordable efficient energy control is important.
http://onsemi.com
Typical applications are DC−DC converters and power management
in portable and battery powered products such as cellular and cordless
phones, PDAs, computers, printers, digital cameras and MP3 players.
Other applications are low voltage motor controls in mass storage
products such as disc drives and tape drives. In the automotive
industry they can be used in air bag deployment and in the instrument
40 VOLTS, 8.0 AMPS
NPN LOW VCE(sat) TRANSISTOR
EQUIVALENT RDS(on) 44 mW
COLLECTOR
3
2
cluster. The high current gain allows e PowerEdge devices to be
driven directly from PMU’s control outputs, and the Linear Gain
(Beta) makes them ideal components in analog amplifiers.
1
BASE
• These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
2
EMITTER
MAXIMUM RATINGS (T = 25°C)
A
Rating
Symbol
Max
40
Unit
Vdc
Vdc
Vdc
A
3
Collector-Emitter Voltage
Collector-Base Voltage
Emitter-Base Voltage
V
CEO
V
CBO
V
EBO
40
1
7.0
4.0
8.0
2
Collector Current − Continuous
Collector Current − Peak
Electrostatic Discharge
I
C
SOT−23 (TO−236)
CASE 318
I
A
CM
STYLE 6
ESD
HBM Class 3B
MM Class C
THERMAL CHARACTERISTICS
Characteristic
MARKING DIAGRAM
Symbol
Max
Unit
Total Device Dissipation
P
(Note 1)
460
mW
AC M G
D
T = 25°C
G
A
Derate above 25°C
3.7
mW/°C
°C/W
1
Thermal Resistance,
R
(Note 1)
270
q
JA
Junction−to−Ambient
AC = Specific Device Code
Total Device Dissipation
P
(Note 2)
540
mW
M
G
= Date Code*
= Pb−Free Package
D
T = 25°C
A
Derate above 25°C
4.3
mW/°C
°C/W
(Note: Microdot may be in either location)
Thermal Resistance,
R
(Note 2)
230
q
JA
*Date Code orientation and/or overbar may
vary depending upon manufacturing location.
Junction−to−Ambient
Junction and Storage
Temperature Range
T , T
−55 to
°C
J
stg
+150
ORDERING INFORMATION
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
†
Device
Package
Shipping
NSS40401LT1G
SOT−23
3000/Tape & Reel
2
2
1. FR−4 @ 100 mm , 1 oz. copper traces.
(Pb−Free)
2. FR−4 @ 500 mm , 1 oz. copper traces.
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
© Semiconductor Components Industries, LLC, 2011
1
Publication Order Number:
December, 2011 − Rev. 0
NSS40401L/D