NSS40400CF8T1G
40 V, 7 A, Low VCE(sat)
PNP Transistor
2
ON Semiconductor’s e PowerEdge family of low V
CE(sat)
transistors are miniature surface mount devices featuring ultra low
saturation voltage (V ) and high current gain capability. These
are designed for use in low voltage, high speed switching applications
where affordable efficient energy control is important.
CE(sat)
http://onsemi.com
40 VOLTS
7.0 AMPS
PNP LOW VCE(sat) TRANSISTOR
EQUIVALENT RDS(on) 78 mW
Typical application are DC−DC converters and power management
in portable and battery powered products such as cellular and cordless
phones, PDAs, computers, printers, digital cameras and MP3 players.
Other applications are low voltage motor controls in mass storage
products such as disc drives and tape drives. In the automotive
industry they can be used in air bag deployment and in the instrument
COLLECTOR
1, 2, 3, 6, 7, 8
2
cluster. The high current gain allows e PowerEdge devices to be
driven directly from PMU’s control outputs, and the Linear Gain
(Beta) makes them ideal components in analog amplifiers.
4
BASE
MAXIMUM RATINGS (T = 25°C)
A
Rating
Symbol
Max
−40
Unit
Vdc
Vdc
Vdc
Adc
A
5
EMITTER
Collector-Emitter Voltage
Collector-Base Voltage
Emitter-Base Voltage
V
CEO
V
CBO
V
EBO
−60
ChipFET]
CASE 1206A
STYLE 4
−5.0
−4.0
−7.0
Collector Current − Continuous
Collector Current − Peak
Electrostatic Discharge
I
C
I
CM
PIN
MARKING
DIAGRAM
ESD
HBM Class 3B
MM Class C
CONNECTIONS
THERMAL CHARACTERISTICS
Characteristic
8
7
6
5
1
2
3
4
C
C
C
E
C
C
C
B
1
2
3
4
8
7
6
5
Symbol
Max
Unit
Total Device Dissipation, T = 25°C
P
(Note 1)
650
5.2
mW
mW/°C
A
D
Derate above 25°C
Thermal Resistance,
Junction−to−Ambient
R
q
(Note 1)
192
°C/W
JA
Total Device Dissipation, T = 25°C
P
(Note 2)
D
1.57
12.7
W
mW/°C
A
Derate above 25°C
VS9 = Specific Device Code
Thermal Resistance,
Junction−to−Ambient
R
(Note 2)
79
°C/W
°C/W
W
q
JA
M
= Month Code
G
= Pb−Free Package
(Note: Microdot may be in either location)
Thermal Resistance,
Junction−to−Lead #1
R
q
JL
15
ORDERING INFORMATION
Total Device Dissipation
(Single Pulse < 10 sec)
P
2.75
Dsingle
(Notes 2 & 3)
†
Device
NSS40400CF8T1G
Package
Shipping
Junction and Storage
Temperature Range
T , T
−55 to
+150
°C
J
stg
ChipFET
3000/
(Pb−Free)
Tape & Reel
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
2
1. FR−4 @ 100 mm , 2 oz copper traces.
2
2. FR−4 @ 500 mm , 2 oz copper traces.
3. Thermal response.
©
Semiconductor Components Industries, LLC, 2006
1
Publication Order Number:
January, 2006 − Rev. 0
NSS40400CF8/D