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54ACTQ574DMQB PDF预览

54ACTQ574DMQB

更新时间: 2024-01-24 02:08:33
品牌 Logo 应用领域
美国国家半导体 - NSC 触发器
页数 文件大小 规格书
8页 24K
描述
Octal D Flip-Flop with TRI-STATE Outputs

54ACTQ574DMQB 技术参数

生命周期:Obsolete包装说明:SOP,
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.84Is Samacsys:N
其他特性:BROADSIDE VERSION OF 374系列:ACT
JESD-30 代码:R-PDSO-G20长度:12.8 mm
逻辑集成电路类型:BUS DRIVER位数:8
功能数量:1端口数量:2
端子数量:20最高工作温度:125 °C
最低工作温度:-55 °C输出特性:3-STATE
输出极性:TRUE封装主体材料:PLASTIC/EPOXY
封装代码:SOP封装形状:RECTANGULAR
封装形式:SMALL OUTLINE传播延迟(tpd):11 ns
认证状态:Not Qualified座面最大高度:2.65 mm
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子形式:GULL WING端子节距:1.27 mm
端子位置:DUAL宽度:7.5 mm
Base Number Matches:1

54ACTQ574DMQB 数据手册

 浏览型号54ACTQ574DMQB的Datasheet PDF文件第2页浏览型号54ACTQ574DMQB的Datasheet PDF文件第3页浏览型号54ACTQ574DMQB的Datasheet PDF文件第4页浏览型号54ACTQ574DMQB的Datasheet PDF文件第5页浏览型号54ACTQ574DMQB的Datasheet PDF文件第6页浏览型号54ACTQ574DMQB的Datasheet PDF文件第7页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 07/16/96  
Last Update Date: 05/25/99  
MN54ACTQ574-X REV 2A0  
Last Major Revision Date: 03/12/99  
Octal D Flip-Flop with TRI-STATE Outputs  
General Description  
The ACTQ574 is a high-speed, low-power octal D-type flip-flop with a buffered Common Clock  
(CP) and a buffered common Output Enable(OE). The information presented to the D inputs  
is stored in the flip-flops on the LOW-to-HIGH clock (CP) transition.  
The ACTQ574 utilizes Quiet Series technology to guarantee quiet output switching and  
improve dynamic threshold performance. FACT Quiet Series TM features G TO TM output  
control and undershoot corrector in addition to a split ground bus for superior  
performance.  
The ACTQ574 is functionally identical to the ACTQ374 but with different pin-out.  
Industry Part Number  
NS Part Numbers  
54ACTQ574  
54ACTQ574DMQB  
54ACTQ574FMQB  
54ACTQ574LMQB  
Prime Die  
D574  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
+25 C  
+125 C  
-55 C  
2
Static tests at  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
Quality Conformance Inspection  
5
6
MIL-STD-883 5005  
7
8A  
8B  
9
10  
11  
1

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