NIF5002N
Preferred Device
Self−Protected FET
with Temperature and
Current Limit
42 V, 2.0 A, Single N−Channel, SOT−223
http://onsemi.com
HDPlust devices are an advanced series of power MOSFETs
which utilize ON Semiconductors latest MOSFET technology process
to achieve the lowest possible on−resistance per silicon area while
incorporating smart features. Integrated thermal and current limits
work together to provide short circuit protection. The devices feature
an integrated Drain−to−Gate Clamp that enables them to withstand
high energy in the avalanche mode. The Clamp also provides
additional safety margin against unexpected voltage transients.
Electrostatic Discharge (ESD) protection is provided by an integrated
Gate−to−Source Clamp.
V
(BR)DSS
R
TYP
I
MAX
DS(ON)
(Clamped)
D
42 V
165 mW @ 10 V
2.0 A*
*Max current limit value is dependent on input
condition.
Drain
Overvoltage
Protection
M
PWR
Gate
Input
R
G
Features
• Current Limitation
ESD Protection
• Thermal Shutdown with Automatic Restart
• Short Circuit Protection
Temperature
Limit
Current
Limit
Current
Sense
• I
Specified at Elevated Temperature
DSS
• Avalanche Energy Specified
• Slew Rate Control for Low Noise Switching
• Overvoltage Clamped Protection
• Pb−Free Packages are Available
Source
4
SOT−223
CASE 318E
STYLE 3
Applications
1
2
3
• Lighting
• Solenoids
• Small Motors
MARKING DIAGRAM
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
J
1
Rating
Symbol
Value
42
Unit
V
GATE
4
2
3
Drain−to−Source Voltage Internally Clamped
V
DSS
DGR
DRAIN
DRAIN
Drain−to−Gate Voltage Internally Clamped
V
42
V
(R = 1.0 MW)
G
SOURCE
Gate−to−Source Voltage
Continuous Drain Current
Power Dissipation
V
"14
V
GS
I
Internally Limited
D
A
Y
W
= Assembly Location
= Year
= Work Week
@ T = 25°C (Note 1)
P
1.1
1.7
8.9
W
A
D
@ T = 25°C (Note 2)
A
@ T = 25°C (Note 3)
T
5002N = Specific Device Code
Operating Junction and Storage Temperature
T , T
−55 to
150
°C
J
stg
G
= Pb−Free Package
(Note: Microdot may be in either location)
Single Pulse Drain−to−Source Avalanche Energy
E
AS
150
mJ
(V = 32 V, V = 5.0 V, I = 1.0 A,
DD
G
PK
ORDERING INFORMATION
See detailed ordering and shipping information in the package
L = 300 mH, R
= 25 W)
G(ext)
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
dimensions section on page 4 of this data sheet.
Preferred devices are recommended choices for future use
and best overall value.
© Semiconductor Components Industries, LLC, 2006
1
Publication Order Number:
April, 2006 − Rev. 7
NIF5002N/D