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NAND99R4M2BZBA5E PDF预览

NAND99R4M2BZBA5E

更新时间: 2024-11-09 18:22:31
品牌 Logo 应用领域
恒忆 - NUMONYX 动态存储器内存集成电路
页数 文件大小 规格书
33页 724K
描述
Memory Circuit, Flash+SDRAM, PBGA149, 10 X 13.50 MM, 1.20 MM HEIGHT, 0.80 MM PITCH, ROHS COMPLIANT, TFBGA-149

NAND99R4M2BZBA5E 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Obsolete零件包装代码:BGA
包装说明:FBGA, BGA149,12X16,32针数:149
Reach Compliance Code:unknownHTS代码:8542.32.00.71
风险等级:5.84JESD-30 代码:R-PBGA-B149
内存集成电路类型:MEMORY CIRCUIT混合内存类型:FLASH+SDRAM
端子数量:149最高工作温度:85 °C
最低工作温度:-30 °C封装主体材料:PLASTIC/EPOXY
封装代码:FBGA封装等效代码:BGA149,12X16,32
封装形状:RECTANGULAR封装形式:GRID ARRAY
峰值回流温度(摄氏度):NOT SPECIFIED电源:1.8 V
认证状态:Not Qualified子类别:Other Memory ICs
标称供电电压 (Vsup):1.8 V表面贴装:YES
温度等级:OTHER端子形式:BALL
端子节距:0.8 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIEDBase Number Matches:1

NAND99R4M2BZBA5E 数据手册

 浏览型号NAND99R4M2BZBA5E的Datasheet PDF文件第2页浏览型号NAND99R4M2BZBA5E的Datasheet PDF文件第3页浏览型号NAND99R4M2BZBA5E的Datasheet PDF文件第4页浏览型号NAND99R4M2BZBA5E的Datasheet PDF文件第5页浏览型号NAND99R4M2BZBA5E的Datasheet PDF文件第6页浏览型号NAND99R4M2BZBA5E的Datasheet PDF文件第7页 
NANDxxxxMx  
256/512-Mbit or 1-Gbit (x8/x16, 1.8/2.6 V, 528-byte page) NAND  
flash and 256/512-Mbit (x16/x32, 1.8 V) LPSDRAM, MCP or PoP  
Features  
FBGA  
n
Packages  
– MCP (multichip package)  
– PoP (package on package)  
TFBGA107 10.5 × 13 × 1.2 mm (ZBB)  
TFBGA149 10 × 13.5 × 1.2 mm (ZBA)  
TFBGA137 10.5 × 13 × 1.2 mm (ZBC)  
LFBGA137 10.5 × 13 × 1.4 mm (ZBC)  
n
Device composition  
– 1 die of 256 or 512 Mbits or 1 Gbit (x8/x16)  
SLC small page NAND flash memory  
– 1 die of 256 or 512 Mbits (x16 or x32)  
SDR/DDR LPSDRAM  
FBGA  
n
Supply voltages  
– V  
– V  
= 1.7 V to 1.95 V or 2.5 V to 3.6 V  
DDF  
DDD  
TFBGA152 14 x 14 x 1.1 mm (ZPA)  
= V  
= 1.7 V to 1.95 V  
DDQD  
n
n
n
Electronic signature  
n
Data integrity  
®
– 100 000 program/erase cycles  
– 10 years data retention  
ECOPACK packages  
Temperature range: –30 to 85 °C  
Single or double data rate LPSDRAM  
Flash memory  
n
n
n
n
n
n
Interface: ×16 or ×32 bus width  
Deep power-down mode  
n
n
n
n
NAND interface  
– x8/x16 bus width  
– Multiplexed address/data  
1.8 V LVCMOS interface  
Page size  
Quad internal banks controlled by BA0, BA1  
Automatic and controlled precharge  
– x8 device: (512 + 16 spare) bytes  
– x16 device: (256 + 8 spare) words  
Auto refresh and self refresh  
Block size  
– 8 192 refresh cycles/64 ms  
– x8 device: (16K + 512 spare) bytes  
– x16 device: (8K + 256 spare) words  
– Programmable partial array self refresh  
– Auto temperature compensated self refresh  
Page read/program  
n
n
Wrap sequence: sequential/interleave  
– Random access: 12 µs (3 V), 15 µs (1.8 V)  
Burst termination by Burst Stop command and  
Precharge command  
– Sequential access: 30 ns (3 V), 50 ns  
(1.8 V)  
– Page program time: 200 µs (typ)  
Table 1.  
Device summary  
NAND88R3M0 NAND99W3M0 NAND98R4M2  
NAND98R3M0 NAND99W3M1 NAND99R3M1  
NAND98W3M0 NANDA9W3M1  
n
n
Copy back program mode  
– Fast page copy without external buffering  
Fast block erase  
NAND99R3M0 NAND99R4M2  
– Block erase time: 2 ms (typ)  
– Status register  
NAND99R3M2 NAND98W3M1  
NAND98R3M1 NAND98R3M2  
October 2008  
Rev 13  
1/32  
www.numonyx.com  
1

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