品牌 | Logo | 应用领域 |
镁光 - MICRON | / | |
页数 | 文件大小 | 规格书 |
132页 | 1301K | |
描述 | ||
This tech note describes considerations in thermal applications for Micron memory devices, including thermal impedance, thermal resistance, junction temperature, operating temperature, memory reliability, reliability modeling, device reliability, and high-temperature electronics. |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
N25Q128 | NUMONYX |
获取价格 |
128-Mbit, 1.8 V, multiple I/O, 4-Kbyte subsector erase on boot sectors, XiP enabled, seria | |
N25Q128_1 | NUMONYX |
获取价格 |
128-Mbit 3 V, multiple I/O, 4-Kbyte subsector erase on boot sectors,XiP enabled, serial fl | |
N25Q128A11B1240E | NUMONYX |
获取价格 |
128-Mbit, 1.8 V, multiple I/O, 4-Kbyte subsector erase on boot sectors, XiP enabled, seria | |
N25Q128A11B1240F | NUMONYX |
获取价格 |
128-Mbit, 1.8 V, multiple I/O, 4-Kbyte subsector erase on boot sectors, XiP enabled, seria | |
N25Q128A11B1240G | NUMONYX |
获取价格 |
128-Mbit, 1.8 V, multiple I/O, 4-Kbyte subsector erase on boot sectors, XiP enabled, seria | |
N25Q128A11B1241F | MICRON |
获取价格 |
128-Mbit, 1.8 V, multiple I/O, 4-Kbyte subsector erase on boot sectors, XiP enabled, seria | |
N25Q128A11B12A0E | NUMONYX |
获取价格 |
128-Mbit, 1.8 V, multiple I/O, 4-Kbyte subsector erase on boot sectors, XiP enabled, seria | |
N25Q128A11B12A0F | NUMONYX |
获取价格 |
128-Mbit, 1.8 V, multiple I/O, 4-Kbyte subsector erase on boot sectors, XiP enabled, seria | |
N25Q128A11B12A0G | NUMONYX |
获取价格 |
128-Mbit, 1.8 V, multiple I/O, 4-Kbyte subsector erase on boot sectors, XiP enabled, seria | |
N25Q128A11B12H0E | NUMONYX |
获取价格 |
128-Mbit, 1.8 V, multiple I/O, 4-Kbyte subsector erase on boot sectors, XiP enabled, seria |