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N25Q064A13E5340F PDF预览

N25Q064A13E5340F

更新时间: 2024-11-29 14:59:03
品牌 Logo 应用领域
镁光 - MICRON /
页数 文件大小 规格书
81页 1082K
描述
N25Q064A

N25Q064A13E5340F 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:SOP2-16Reach Compliance Code:compliant
风险等级:5.71最大时钟频率 (fCLK):108 MHz
JESD-30 代码:R-PDSO-G16长度:10.3 mm
内存密度:67108864 bit内存集成电路类型:FLASH
内存宽度:8功能数量:1
端子数量:16字数:8388608 words
字数代码:8000000工作模式:SYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:8MX8封装主体材料:PLASTIC/EPOXY
封装代码:SOP封装形状:RECTANGULAR
封装形式:SMALL OUTLINE并行/串行:SERIAL
峰值回流温度(摄氏度):NOT SPECIFIED编程电压:3 V
座面最大高度:2.65 mm最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):2.7 V标称供电电压 (Vsup):3 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子形式:GULL WING
端子节距:1.27 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:7.5 mm
Base Number Matches:1

N25Q064A13E5340F 数据手册

 浏览型号N25Q064A13E5340F的Datasheet PDF文件第2页浏览型号N25Q064A13E5340F的Datasheet PDF文件第3页浏览型号N25Q064A13E5340F的Datasheet PDF文件第4页浏览型号N25Q064A13E5340F的Datasheet PDF文件第5页浏览型号N25Q064A13E5340F的Datasheet PDF文件第6页浏览型号N25Q064A13E5340F的Datasheet PDF文件第7页 
64Mb, 3V, Multiple I/O Serial Flash Memory  
Features  
Micron Serial NOR Flash Memory  
3V, Multiple I/O, 4KB Sector Erase  
N25Q064A  
• Write protection  
Features  
– Software write protection applicable to every  
64KB sector via volatile lock bit  
– Hardware write protection: protected area size  
defined by five nonvolatile bits (BP0, BP1, BP2,  
BP3, and TB)  
• SPI-compatible serial bus interface  
• 108 MHz (MAX) clock frequency  
• 2.7–3.6V single supply voltage  
• Dual/quad I/O instruction provides increased  
throughput up to 432 MHz  
– Additional smart protections, available upon re-  
quest  
• Supported protocols  
– Extended SPI, dual I/O, and quad I/O  
• Execute-in-place (XIP) mode for all three protocols  
– Configurable via volatile or nonvolatile registers  
– Enables memory to work in XIP mode directly af-  
ter power-on  
• PROGRAM/ERASE SUSPEND operations  
• Continuous read of entire memory via a single com-  
mand  
– Fast read  
– Quad or dual output fast read  
– Quad or dual I/O fast read  
• Flexible to fit application  
– Configurable number of dummy cycles  
– Output buffer configurable  
• Electronic signature  
– JEDEC-standard 2-byte signature (BA17h)  
– Unique ID code (UID): 17 read-only bytes, in-  
cluding:  
Two additional extended device ID (EDID)  
bytes to identify device factory options  
• Customized factory data (14 bytes)  
• Minimum 100,000 ERASE cycles per sector  
• More than 20 years data retention  
• Packages JEDEC standard, all RoHS compliant  
– F6 = V-PDFN-8 6mm x 5mm (MLP8 6mm x 5mm)  
– F8 = V-PDFN-8 8mm x 6mm (MLP8 8mm x 6mm)  
– 12 = T-PBGA-24b05 6mm x 8mm  
– 14 = T-PBGA-24b05 6mm x 8mm, 4x6 ball array  
– SF = SOP2-16 300 mils body width (SO16W)  
– SE = SOP2-8 208 mils body width (SO8W)  
• 64-byte, user-lockable, one-time programmable  
(OTP) dedicated area  
• Erase capability  
– Subsector erase 4KB uniform granularity blocks  
– Sector erase 64KB uniform granularity blocks  
– Full-chip erase  
PDF: 09005aef845665f4  
n25q_64mb_3v_65nm.pdf - Rev. K 08/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
1
© 2011 Micron Technology, Inc. All rights reserved.  
Products and specifications discussed herein are subject to change by Micron without notice.  

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